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A two-dimensional fully analytical model with polarization effect for off-state channel potential and electric field distributions of GaN-based field-plated high electron mobility transistor |
Mao Wei (毛维)a, She Wei-Bo (佘伟波)a, Yang Cui (杨翠)b, Zhang Chao (张超)a, Zhang Jin-Cheng (张进成)a, Ma Xiao-Hua (马晓华)b, Zhang Jin-Feng (张金风)a, Liu Hong-Xia (刘红侠)a, Yang Lin-An (杨林安)a, Zhang Kai (张凯)a, Zhao Sheng-Lei (赵胜雷)a, Chen Yong-He (陈永和)a, Zheng Xue-Feng (郑雪峰)a, Hao Yue (郝跃)a |
a Key Laboratory of Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University, Xi'an 710071, China; b School of Physics and Optoelectronic Engineering, Xidian University, Xi'an 710071, China |
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Abstract In this paper, we present a two-dimensional (2D) fully analytical model with consideration of polarization effect for the channel potential and electric field distributions of the gate field-plated high electron mobility transistor (FP-HEMT) on the basis of 2D Poisson's solution. The dependences of the channel potential and electric field distributions on drain bias, polarization charge density, FP structure parameters, AlGaN/GaN material parameters, etc. are investigated. A simple and convenient approach to designing high breakdown voltage FP-HEMTs is also proposed. The validity of this model is demonstrated by comparison with the numerical simulations with Silvaco-Atlas. The method in this paper can be extended to the development of other analytical models for different device structures, such as MIS-HEMTs, multiple-FP HETMs, slant-FP HEMTs, etc.
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Received: 08 October 2013
Revised: 24 November 2013
Accepted manuscript online:
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PACS:
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73.40.Kp
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(III-V semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions)
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85.30.Tv
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(Field effect devices)
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85.30.De
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(Semiconductor-device characterization, design, and modeling)
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Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 61204085 and 61334002) and the Fundamental Research Funds for the Central Universities, China (Grant No. K5051225013). |
Corresponding Authors:
Mao Wei
E-mail: mwxidian@126.com
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Cite this article:
Mao Wei (毛维), She Wei-Bo (佘伟波), Yang Cui (杨翠), Zhang Chao (张超), Zhang Jin-Cheng (张进成), Ma Xiao-Hua (马晓华), Zhang Jin-Feng (张金风), Liu Hong-Xia (刘红侠), Yang Lin-An (杨林安), Zhang Kai (张凯), Zhao Sheng-Lei (赵胜雷), Chen Yong-He (陈永和), Zheng Xue-Feng (郑雪峰), Hao Yue (郝跃) A two-dimensional fully analytical model with polarization effect for off-state channel potential and electric field distributions of GaN-based field-plated high electron mobility transistor 2014 Chin. Phys. B 23 087305
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