Stability of operation versus temperature of a three-phase clock-driven chaotic circuit

doi:10.1088/1674-1056/22/12/120506

Abstract We evaluate the influence of temperature on the behavior of a three-phase clock-driven metal–oxide–semiconductor (MOS) chaotic circuit. The chaotic circuit consists of two nonlinear functions, a level shifter, and three sample and hold blocks. It is necessary to analyze a CMOS-based chaotic circuit with respect to variation in temperature for stability because the circuit is sensitive to the behavior of the circuit design parameters. The temperature dependence of the proposed chaotic circuit is investigated via the simulation program with integrated circuit emphasis (SPICE) using 0.6-μm CMOS process technology with a 5-V power supply and a 20-kHz clock frequency. The simulation results demonstrate the effects of temperature on the chaotic dynamics of the proposed chaotic circuit. The time series, frequency spectra, bifurcation phenomena, and Lyapunov exponent results are provided.

Keywords: chaotic circuit nonlinear functions temperature effect bifurcation Lyapunov exponent

Received: 03 August 2013
Revised: 17 September 2013
Accepted manuscript online:

PACS:	05.45.Gg	(Control of chaos, applications of chaos)
	82.40.Bj	(Oscillations, chaos, and bifurcations)
	85.40.-e	(Microelectronics: LSI, VLSI, ULSI; integrated circuit fabrication technology)
	05.45.-a	(Nonlinear dynamics and chaos)

Fund: Project supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (Grant No. 2011-0011698).

Corresponding Authors: Han Jung Song
E-mail: hjsong@inje.ac.kr

Cite this article:

Zhou Ji-Chao (周继超), Hyunsik Son, Namtae Kim, Han Jung Song Stability of operation versus temperature of a three-phase clock-driven chaotic circuit 2013 Chin. Phys. B 22 120506

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Stability of operation versus temperature of a three-phase clock-driven chaotic circuit

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