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Structural and optical properties of Al1-xInxN epilayers on GaN template grown by metalorganic chemical vapor deposition |
Lu Guo-Jun(卢国军)a), Zhu Jian-Jun(朱建军)a)†, Jiang De-Sheng(江德生)a), Wang Yu-Tian(王玉田) a),Zhao De-Gang(赵德刚)a), Liu Zong-Shun(刘宗顺)a),Zhang Shu-Ming(张书明) a), and Yang Hui(杨辉)a)b) |
a State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, the Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, China; b Suzhou Institute of Nano-tech and Nano-bionics, the Chinese Academy of Sciences, Suzhou 215123, China |
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Abstract This paper reports that Al1-xInxN epilayers were grown on GaN template by metalorganic chemical vapor deposition with an In content of 7%--20%. X-ray diffraction results indicate that all these Al1-xInxN epilayers have a relatively low density of threading dislocations. Rutherford backscattering/channeling measurements provide the exact compositional information and show that a gradual variation in composition of the Al1-xInxN epilayer happens along the growth direction. The experimental results of optical reflection clearly show the bandgap energies of Al1-xInxN epilayers. A bowing parameter of 6.5 eV is obtained from the compositional dependence of the energy gap. The cathodoluminescence peak energy of the Al1-xInxN epilayer is much lower than its bandgap, indicating a relatively large Stokes shift in the Al1-xInxN sample.
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Received: 24 March 2009
Revised: 02 June 2009
Accepted manuscript online:
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PACS:
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68.55.-a
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(Thin film structure and morphology)
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81.15.Gh
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(Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.))
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78.66.Fd
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(III-V semiconductors)
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68.55.Ln
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(Defects and impurities: doping, implantation, distribution, concentration, etc.)
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78.60.Hk
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(Cathodoluminescence, ionoluminescence)
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61.72.Hh
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(Indirect evidence of dislocations and other defects (resistivity, slip, creep, strains, internal friction, EPR, NMR, etc.))
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Fund: Project supported by the National
Natural Science Foundation of China (Grant Nos. 60776047, 60506001,
60476021, 60576003 and 60836003). |
Cite this article:
Lu Guo-Jun(卢国军), Zhu Jian-Jun(朱建军), Jiang De-Sheng(江德生), Wang Yu-Tian(王玉田),Zhao De-Gang(赵德刚), Liu Zong-Shun(刘宗顺),Zhang Shu-Ming(张书明), and Yang Hui(杨辉) Structural and optical properties of Al1-xInxN epilayers on GaN template grown by metalorganic chemical vapor deposition 2010 Chin. Phys. B 19 026804
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