Abstract A code has been developed to simulate the neutralization and grazing process of slow highly charged ion Xeq+ on Al(111) surface under the classical-over-the-barrier model. The image energy gain of Xeq+ ions are calculated and compared with experiment data. The simulation results of image energy gain are in good agreement with the experiment data. Meanwhile, in the present work, the reflection coefficient of incident Xeq+ on Al(111) surface as a function of the incidence angle, energy and charge state is also studied.
Received: 20 December 2006
Revised: 02 February 2007
Accepted manuscript online:
PACS:
34.35.+a
(Interactions of atoms and molecules with surfaces)
(Ion scattering from surfaces (charge transfer, sputtering, SIMS))
Fund: Project supported by the Research Fund for the
Doctoral Program of Higher Education (Grant No~20030730004), the
National Natural Science Foundation of China (Grant No~10374039) and
the Natural Science Foundation of Gansu Province, China
(Grant No~ZS031-A
Cite this article:
Hu Bi-Tao(胡碧涛), Zhang Hong-Jun(张宏俊), Zhang Jian(张健), Song Yu-Shou(宋玉收), Wang Li-Li(王丽丽), Chen Chun-Hua(陈春花), and Gu Jian-Gan(顾建刚) Neutralization process of Xeq+ ion grazing on Al(111) surface 2007 Chinese Physics 16 2918
A shortcut for determining growth mode R. A. Rehman, Cai Yi-Liang (蔡亦良), Zhang Han-Jie (张寒洁), Wu Ke (吴珂), Dou Wei-Dong (窦卫东), Li Hai-Yang (李海洋), He Pi-Mo (何丕模), Bao Shi-Ning (鲍世宁). Chin. Phys. B, 2013, 22(10): 107202.
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