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Improvement in bias current redistribution in superconducting strip ion detectors with parallel configuration |
| Nobuyuki Zen, Go Fujii, Shigetomo Shiki, Masahiro Ukibe, Masaki Koike, Masataka Ohkubo |
| National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, 305-8568 Ibaraki, Japan |
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Abstract In time-of-flight mass spectrometry (TOF MS), superconducting strip ion detectors (SSIDs) in the parallel configuration are promising for ideal ion detection with a nanosecond-scale time response and a practical large sensitive area. In the parallel configuration, the bias current in one strip is diverted into other parallel strips after each detection event. Under high bias current conditions, the diverted bias current induces cascade switching of all parallel strips. Studies show that cascade switching degrades the ion count rate of SSIDs made from niobium and hence is disliked in TOF MS applications. To suppress the bias current redistribution, we connected resistors in a series with the individual parallel strips using aluminum-bonding wires. Their effect was studied by measuring the pulse height distributions.
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Received: 13 January 2015
Revised: 05 March 2015
Accepted manuscript online:
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PACS:
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85.25.-j
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(Superconducting devices)
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07.75.+h
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(Mass spectrometers)
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34.35.+a
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(Interactions of atoms and molecules with surfaces)
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| Fund: Project supported by a Grant-in-Aid for Scientific Research (A) and (C) from the Japan Society for the Promotion of Science (Grant Nos. 22246056 and 24619013). |
Corresponding Authors:
Nobuyuki Zen
E-mail: n.zen@aist.go.jp
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Cite this article:
Nobuyuki Zen, Go Fujii, Shigetomo Shiki, Masahiro Ukibe, Masaki Koike, Masataka Ohkubo Improvement in bias current redistribution in superconducting strip ion detectors with parallel configuration 2015 Chin. Phys. B 24 098501
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