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Chinese Physics, 2001, Vol. 10(8): 716-719    DOI: 10.1088/1009-1963/10/8/309
ATOMIC AND MOLECULAR PHYSICS Prev   Next  

PRECISE MEASUREMENT OF DENSITY-DEPENDENT SHIFT BY WAVELENGTH MODULATION REFLECTION SPECTROSCOPY

Xiao Lian-tuan (肖连团), Zhao Jian-ming (赵建明), Li Chang-yong (李昌勇), Jia Suo-tang (贾锁堂), Zhou Guo-sheng (周国生)
Department of Electronics and Information Technology, Shanxi University Taiyuan 030006 and Key Laboratory of Quantum Optics, Ministry of Education, China
Abstract  The density dependence of the line shift of the cesium D2 line is studied with sub-Doppler selective reflection spectroscopy. By use of wavelength modulation and sixth-harmonics detection we observed the coefficient of the pressure-induced shift of the 6S1/2(F=4)→6P3/2(F'=3) hyperfine transition of the cesium D2 line $\Delta \delta/\rho$ = -0.9(5)×10-8cm3. In the limit $\rho=0$ a frequency shift about -3MHz remains, which may be attributed to long-range atom-surface interactions. The experimental results can be used in measurements of the local field-induced frequency shift at high atomic densities with sufficient accuracy.
Keywords:  selective reflection      sub-Doppler      wavelength modulation spectroscopy      harmonic detection  
Received:  15 February 2001      Revised:  23 February 2001      Accepted manuscript online: 
PACS:  32.70.Jz (Line shapes, widths, and shifts)  
  32.10.Fn (Fine and hyperfine structure)  
  34.50.Dy  
Fund: Project supported by the National Natural Science Foundation of China (Grant No. 19774039, 60078009) and the Natural Science Foundation of Shanxi Province.

Cite this article: 

Xiao Lian-tuan (肖连团), Zhao Jian-ming (赵建明), Li Chang-yong (李昌勇), Jia Suo-tang (贾锁堂), Zhou Guo-sheng (周国生) PRECISE MEASUREMENT OF DENSITY-DEPENDENT SHIFT BY WAVELENGTH MODULATION REFLECTION SPECTROSCOPY 2001 Chinese Physics 10 716

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