| CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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Unveiling localized electronic properties of ReS2 thin layers at nanoscale using Kelvin force probe microscopy combined with tip-enhanced Raman spectroscopy |
| Yu Luo(罗宇)1, Weitao Su(苏伟涛)1,†, Juanjuan Zhang(张娟娟)2,‡, Fei Chen(陈飞)3, Ke Wu(武可)1, Yijie Zeng(曾宜杰)1, and Hongwei Lu(卢红伟)1 |
1 School of Sciences, Hangzhou Dianzi University, Hangzhou 310018, China;
2 Hunan Petrochemical Vocational Technology College, Yueyang 414011, China;
3 College of Materials and Environmental Engineering, Hangzhou Dianzi University, Hangzhou 310018, China |
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Abstract Electronic properties of two-dimensional (2D) materials can be strongly modulated by localized strain. The typical spatial resolution of conventional Kelvin probe force microscopy (KPFM) is usually limited in a few hundreds of nanometers, and it is difficult to characterize localized electronic properties of 2D materials at nanoscales. Herein, tip-enhanced Raman spectroscopy (TERS) is proposed to combine with KPFM to break this restriction. TERS scan is conducted on ReS2 bubbles deposited on a rough Au thin film to obtain strain distribution by using the Raman peak shift. The localized contact potential difference (CPD) is inversely calculated with a higher spatial resolution by using strain measured by TERS and CPD-strain working curve obtained using conventional KPFM and atomic force microscopy. This method enhances the spatial resolution of CPD measurements and can be potentially used to characterize localized electronic properties of 2D materials.
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Received: 24 April 2023
Revised: 01 July 2023
Accepted manuscript online: 05 July 2023
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PACS:
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78.67.-n
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(Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures)
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07.79.Fc
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(Near-field scanning optical microscopes)
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07.79.Lh
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(Atomic force microscopes)
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| Fund: Project supported by the Zhejiang Provincial Natural Science Foundation of China (Grant No. LZ22A040003) and the National Natural Science Foundation of China (Grant No. 52027809). |
Corresponding Authors:
Weitao Su, Juanjuan Zhang
E-mail: suweitao@hdu.edu.cn;josephy881006@163.com
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Cite this article:
Yu Luo(罗宇), Weitao Su(苏伟涛), Juanjuan Zhang(张娟娟), Fei Chen(陈飞), Ke Wu(武可), Yijie Zeng(曾宜杰), and Hongwei Lu(卢红伟) Unveiling localized electronic properties of ReS2 thin layers at nanoscale using Kelvin force probe microscopy combined with tip-enhanced Raman spectroscopy 2023 Chin. Phys. B 32 117801
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