Direct measurement of an energy-dependent single-event-upset cross-section with time-of-flight method at CSNS

doi:10.1088/1674-1056/aca603

Abstract To predict the soft error rate for applications, it is essential to study the energy dependence of the single-event-upset (SEU) cross-section. In this work, we present a direct measurement of the SEU cross-section with the Back-n white neutron source at the China Spallation Neutron Source. The measured cross section is consistent with the soft error data from the manufacturer and the result suggests that the threshold energy of the SEU is about 0.5 MeV, which confirms the statement in Iwashita's report that the threshold energy for neutron soft error is much below that of the (n, α) cross-section of silicon. In addition, an index of the effective neutron energy is suggested to characterize the similarity between a spallation neutron beam and the standard atmospheric neutron environment.

Keywords: static random-access memory soft error rate neutron SEU cross-section time-of-flight

Received: 13 October 2022
Revised: 08 November 2022
Accepted manuscript online: 25 November 2022

PACS:	07.89.+b	(Environmental effects on instruments (e.g., radiation and pollution effects))
	25.40.Lw	(Radiative capture)
	61.80.Hg	(Neutron radiation effects)
	61.82.Fk	(Semiconductors)

Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 2032165 and 62004158), the National Key Scientific Instrument and Equipment Development Project of China (Grant No. 52127817), the State Key Laboratory of Particle Detection and Electronics (Grant Nos. SKLPDE-ZZ-201801 and SKLPDE-ZZ-202008), and the Special Funds for Science and Technology Innovation Strategy of Guangdong Province, China (Grant No. 2018A0303130030).

Corresponding Authors: Zhixin Tan, Yongning He
E-mail: tanzhixin@ihep.ac.cn;yongning@xjtu.edu.cn

Cite this article:

Biao Pei(裴标), Zhixin Tan(谭志新), Yongning He(贺永宁), Xiaolong Zhao(赵小龙), and Ruirui Fan(樊瑞睿) Direct measurement of an energy-dependent single-event-upset cross-section with time-of-flight method at CSNS 2023 Chin. Phys. B 32 020705

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