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Probing thermal properties of vanadium dioxide thin films by time-domain thermoreflectance without metal film |
| Qing-Jian Lu(陆青鑑)1,2, Min Gao(高敏)1,2,†, Chang Lu(路畅)1,2, Fei Long(龙飞)3, Tai-Song Pan(潘泰松)1,2, and Yuan Lin(林媛)1,2,4,‡ |
1 School of Materials and Energy, University of Electronic Science and Technology of China, Chengdu 610054, China;
2 State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China;
3 Guangxi Key Laboratory of Optical and Electronic Materials and Devices, School of Materials Science and Engineering, Guilin University of Technology, Guilin 541004, China;
4 Medico-Engineering Cooperation on Applied Medicine Research Center, University of Electronic Science and Technology of China, Chengdu 610054, China |
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Abstract Vanadium dioxide (VO2) is a strongly correlated material, and it has become known due to its sharp metal-insulator transition (MIT) near room temperature. Understanding the thermal properties and their change across MIT of VO2 thin film is important for the applications of this material in various devices. Here, the changes in thermal conductivity of epitaxial and polycrystalline VO2 thin film across MIT are probed by the time-domain thermoreflectance (TDTR) method. The measurements are performed in a direct way devoid of deposition of any metal thermoreflectance layer on the VO2 film to attenuate the impact from extra thermal interfaces. It is demonstrated that the method is feasible for the VO2 films with thickness values larger than 100 nm and beyond the phase transition region. The observed reasonable thermal conductivity change rates across MIT of VO2 thin films with different crystal qualities are found to be correlated with the electrical conductivity change rate, which is different from the reported behavior of single crystal VO2 nanowires. The recovery of the relationship between thermal conductivity and electrical conductivity in VO2 film may be attributed to the increasing elastic electron scattering weight, caused by the defects in the film. This work demonstrates the possibility and limitation of investigating the thermal properties of VO2 thin films by the TDTR method without depositing any metal thermoreflectance layer.
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Received: 30 December 2020
Revised: 01 February 2021
Accepted manuscript online: 01 March 2021
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PACS:
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68.60.Dv
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(Thermal stability; thermal effects)
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66.30.Xj
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(Thermal diffusivity)
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| Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 61825102, 51872038, and 52021001) and the “111” Project, China (Grant No. B18011). |
Corresponding Authors:
Min Gao, Yuan Lin
E-mail: mingao@uestc.edu.cn;linyuan@uestc.edu.cn
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Cite this article:
Qing-Jian Lu(陆青鑑), Min Gao(高敏), Chang Lu(路畅), Fei Long(龙飞), Tai-Song Pan(潘泰松), and Yuan Lin(林媛) Probing thermal properties of vanadium dioxide thin films by time-domain thermoreflectance without metal film 2021 Chin. Phys. B 30 096801
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[1] Jerominek H, Picard F and Vincent D 1993 Opt. Eng. 32 2092
[2] Lu C, Liang W, Gao M, Luo S N and Lin Y 2019 IEEE Trans. Terahertz Sci. Technol. 9 177
[3] Zhou G, Dai P, Wu J, Jin B, Wen Q, Zhu G, Shen Z, Zhang C, Kang L, Xu W, Chen J and Wu P 2017 Opt. Express 25 17322
[4] Wu C, Feng F and Xie Y 2013 Chem. Soc. Rev. 42 5157
[5] Kruger B A, Joushaghani A and Poon J K S 2012 Opt. Express 20 23598
[6] Zhao J X, Song J L, Zhou Y, Liu Y C and Zhou J H 2020 Chin. Phys. Lett. 37 064204
[7] Kizuka H, Yagi T, Jia J, Yamashita Y, Nakamura S, Taketoshi N and Shigesato Y 2015 Jpn. J. Appl. Phys. 54 053201
[8] Oh D W, Ko C, Ramanathan S and Cahill D G 2010 Appl. Phys. Lett. 96 151906
[9] Dahal K, Zhang Q, He R, Mishra I K and Ren Z 2017 J. Appl. Phys. 121 155103
[10] Sangwook L, Hippalgaonkar K, Yang F, Hong J, Ko C, Suh J, Liu K, Wang K, Urban J J, Zhang X, Dames C, Hartnoll S A, Delaire O and Wu J 2017 Science 355 371
[11] Jin L, Zeltmann S E, Choe H S, Liu H, Allen F I, Minor A M and Wu J 2020 Phys. Rev. B 102 041120
[12] Chen L, Xiang Z, Tinsman C, Asaba T, Huang Q, Zhou H and Li L 2018 Appl. Phys. Lett. 113 061902
[13] Cahill D G 2004 Rev. Sci. Instrum. 75 5119
[14] Taketoshi N, Baba T, Schaub E and Ono A 2003 Rev. Sci. Instrum. 74 5226
[15] Capinski W S and Maris H J 1996 Rev. Sci. Instrum. 67 2720
[16] Bonello B, Perrin B and Rossignol C 1998 J. Appl. Phys. 83 3081
[17] Baba T, Taketoshi N and Yagi T 2011 Jpn. J. Appl. Phys. 50 11RA01
[18] Piotrowski M, Franco M, Sousa V, Rodrigues J, Deepak F L, Kakefuda Y, Kawamoto N, Baba T, Owens-Baird B, Alpuim P, Kovnir K, Mori T and Kolen'ko Y V 2018 J. Phys. Chem. C 122 27127
[19] Kakefuda Y, Yubuta K, Shishido T, Yoshikawa A, Okada S, Ogino H, Kawamoto N, Baba T and Mori T 2017 APL Mater. 5 126103
[20] Liu K, Zhao J, Sun H, Guo H, Dai B and Zhu J 2019 Chin. Phys. B 28 060701
[21] Zhang Y Y, Cheng R, Ni D, Tian M, Lu J W and Zhao Y 2019 Chin. Phys. B 28 078105
[22] Jia Q X, McCleskey T M, Burrell A K, Lin Y, Collis G E, Wang H, Li A D Q and Foltyn S R 2004 Nat. Mater. 3 529
[23] Ji Y D, Pan T S, Bi Z, Liang W Z, Zhang Y, Zeng H Z, Wen Q Y, Zhang H W, Chen C L, Jia Q X and Lin Y 2012 Appl. Phys. Lett. 101
[24] Liang W, Gao M, Lu C, Zhang Z, Chan C H, Zhuge L, Dai J, Yang H, Chen C, Park B H, Jia Q and Lin Y 2018 ACS Appl. Mater. Interfaces 10 8341
[25] Allen P B, Wentzcovitch R M, Schulz W W and Canfield P C 1993 Phys. Rev. B 48 4359
[26] Qazilbash M M, Burch K S, Whisler D, Shrekenhamer D, Chae B G, Kim H T and Basov D N 2006 Phys. Rev. B 74 205118 |
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