Energy spectrum of multi-radiation of X-rays in a low energy Mather-type plasma focus device

doi:10.1088/1674-1056/23/6/065203

Abstract The multi-radiation of X-rays was investigated with special attention to their energy spectrum in a Mather-type plasma focus device (operated with argon gas). The analysis is based on the effect of anomalous resistances. To study the energy spectrum, a four-channel diode X-ray spectrometer was used along with a special set of filters. The filters were suitable for detection of medium range X-rays as well as hard X-rays with energy exceeding 30 keV. The results indicate that the anomalous resistivity effect during the post pinch phase may cause multi-radiation of X-rays with a total duration of 300± 50 ns. The significant contribution of Cu-Kα was due to the medium range X-rays, nonetheless, hard X-rays with energies greater than 15 keV also participate in the process. The total emitted X-ray energy in the forms of Cu-K_α and Cu-K_β was around 0.14± 0.02 (J/Sr) and 0.04± 0.01 (J/Sr), respectively. The total energy of the emitted hard X-ray (> 15 keV) was around 0.12± 0.02 (J/Sr).

Keywords: Mather-type plasma focus device hard X-rays multi-radiation tube multiple voltage peaks anomalous resistances

Received: 27 October 2013
Revised: 11 January 2014
Accepted manuscript online:

PACS:	52.58.Lq	(Z-pinches, plasma focus, and other pinch devices)
	52.59.Px	(Hard X-ray sources)
	52.70.La	(X-ray and γ-ray measurements)
	33.20.Rm	(X-ray spectra)

Corresponding Authors: Farzin M. Aghamir
E-mail: aghamir@ut.ac.ir

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Farzin M. Aghamir, Reza A. Behbahani Energy spectrum of multi-radiation of X-rays in a low energy Mather-type plasma focus device 2014 Chin. Phys. B 23 065203

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Energy spectrum of multi-radiation of X-rays in a low energy Mather-type plasma focus device

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