SIMULATION OF MULTIPLE FRACTAL AND COMPACT GROWTH OF ULTRA-THIN FILMS ON HEXAGONAL SUBSTRATE
Wang Dai-mu (王戴木)a, Wu Zi-qin (吴自勤)b
a Department of Physics, Fuyang Teachers College, Fuyang 236032, China; b Center of Fundamental Physics, University of Science and Technology of China, Hefei 230026, China
Abstract The multiple cluster growth of ultra-thin films with different deposition rate and different substrate temperature has been studied by kinetic Monte-Carlo simulation. With increasing diffusion rate along cluster edges (corresponding to an increasing substrate temperature), pattern structures change smoothly from fractal islands, compact islands with random shapes, to regular islands, and the average branch width of clusters increases continuously up to some constant value in the compact island limit. The formation of the multiple fractal and compact clusters can be described quantitatively by multifractal. The results of multifractal analysis show that with pattern change from fractal to compact islands, the Hausdorff dimension D0, the information dimension D1, and the correlation dimension D2 decrease, while the width and height of the multifractal spectra increase.
Received: 24 November 1999
Accepted manuscript online:
PACS:
64.60.A-
(Specific approaches applied to studies of phase transitions)
Fund: Project supported by the Natural Science Foundation of Auhui Province, China (Grant No. 99047217).
Cite this article:
Wang Dai-mu (王戴木), Wu Zi-qin (吴自勤) SIMULATION OF MULTIPLE FRACTAL AND COMPACT GROWTH OF ULTRA-THIN FILMS ON HEXAGONAL SUBSTRATE 2000 Chinese Physics 9 368
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