Wang Jing-cheng (王景成)a, You Fu-qiang (尤富强)a, Yin Jun-lin (殷俊林)a, Tang Xue-feng (汤学峰)b, Qi Jin-lin (祁金林)b
a Research Center, Shanghai Iron & Steel Research Institute, Shanghai Bao Steel Corporation. Shanghai City Key Laboratory of Metal-Functional Materials, Shanghai 200940, China; b Department of Physics, Tongji University, Shanghai 200092, China
Abstract A number of TiNi samples with different compositions and states were measured by positron annihilation technique. And microdefects and the influence of them on shape memory effect were analyzed, giving some valuable information for the study of technological processes of preparing TiNi functional shape memory devices.
Received: 02 May 1999
Revised: 26 July 1999
Accepted manuscript online:
Wang Jing-cheng (王景成), You Fu-qiang (尤富强), Yin Jun-lin (殷俊林), Tang Xue-feng (汤学峰), Qi Jin-lin (祁金林) POSITRON STUDY OF DEFECTS IN TiNi ALLOYS 2000 Chinese Physics 9 216
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