Z-scan analysis of high-order nonlinear refraction effect induced by using elliptic Gaussian beam

doi:10.1088/1674-1056/19/6/067802

Abstract The irradiance of an elliptic Gaussian beam that is high enough to excite high-order nonlinear refraction effect is used to calculate the normalized on-axis transmittance function in the z-scan technique by introducing complex beam parameters which make the calculation simpler. The transmittance formula is applied to the first-, first two-, and first three-order nonlinearities. Numerical evaluation shows that the symmetry no longer holds when using an elliptic Gaussian beam instead of a circular Gaussian beam. A distortion is observed in the central part of the curve, which decreases as ellipticity increases. Moreover, the variation of the normalized peak-valley difference decreases as ellipticity decreases.

Keywords: z-scan elliptic Gaussian beam complex beam parameter high order

Received: 21 May 2009
Accepted manuscript online:

PACS:	42.60.Jf	(Beam characteristics: profile, intensity, and power; spatial pattern formation)
	42.65.-k	(Nonlinear optics)

Fund: Project supported by the National Natural Science Foundation of China (Grant No.~10574011).

Cite this article:

Guo Shi-Fang(郭世方) and Tian Qiang(田强) Z-scan analysis of high-order nonlinear refraction effect induced by using elliptic Gaussian beam 2010 Chin. Phys. B 19 067802

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Z-scan analysis of high-order nonlinear refraction effect induced by using elliptic Gaussian beam

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