CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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Investigation of Zn1-xCdxO films bandgap and Zn1-xCdxO/ZnO heterojunctions band offset by x-ray photoelectron spectroscopy |
Jie Chen(陈杰), Xue-Min Wang(王雪敏), Ji-Cheng Zhang(张继成), Hong-Bu Yin(尹泓卜), Jian Yu(俞健), Yan Zhao(赵妍), Wei-Dong Wu(吴卫东) |
Science and Technology on Plasma Physics Laboratory, Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China |
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Abstract A series of Zn1-xCdxO thin films have been fabricated on sapphire by pulsed-laser deposition (PLD), successfully. To investigate the effect of Cd concentration on structural and optical properties of Zn1-xCdxO films, x-ray diffraction (XRD), ultraviolet-visible spectroscopy (UV-vis), and x-ray photoelectron spectroscopy (XPS) are employed to characterize the films in detail. The XRD pattern indicates that the Zn1-xCdxO thin films have high single-orientation of the c axis. The energy bandgap values of ZnCdO thin films decrease from 3.26 eV to 2.98 eV with the increasing Cd concentration (x) according to the (αhν)2-hν curve. Furthermore, the band offsets of Zn1-xCdxO/ZnO heterojunctions are determinated by XPS, indicating that a type-I alignment takes place at the interface and the value of band offset could be tuned by adjusting the Cd concentration.
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Received: 01 March 2017
Revised: 19 April 2017
Accepted manuscript online:
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PACS:
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73.61.Ga
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(II-VI semiconductors)
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78.20.Ci
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(Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity))
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68.60.-p
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(Physical properties of thin films, nonelectronic)
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Fund: Project supported by the National Natural Science Foundation of China (Grant No. 11404302) and the Laser Fusion Research Center Funds for Young Talents (Grant No. RCFPD1-2017-9). |
Corresponding Authors:
Yan Zhao, Wei-Dong Wu
E-mail: zhaoyan267@163.com;wuweidongding@163.com
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About author: 0.1088/1674-1056/26/8/ |
Cite this article:
Jie Chen(陈杰), Xue-Min Wang(王雪敏), Ji-Cheng Zhang(张继成), Hong-Bu Yin(尹泓卜), Jian Yu(俞健), Yan Zhao(赵妍), Wei-Dong Wu(吴卫东) Investigation of Zn1-xCdxO films bandgap and Zn1-xCdxO/ZnO heterojunctions band offset by x-ray photoelectron spectroscopy 2017 Chin. Phys. B 26 087309
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