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Determining the sign of g factor via time-resolved Kerr rotation spectroscopy with a rotatable magnetic field |
Gu Xiao-Fang(谷晓芳), Qian Xuan(钱轩), Ji Yang(姬扬), Chen Lin(陈林), and Zhao Jian-Hua(赵建华) |
State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China |
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Abstract Time-resolved Kerr rotation spectroscopy is used to determine the sign of the g factor of carriers in a semiconductor material, with the help of a rotatable magnetic field in the plane of the sample. The spin precession signal of carriers at a fixed time delay is measured as a function of the orientation of the magnetic field with a fixed strength B. The signal has a sine-like form and its phase determines the sign of the g factor of carriers. As a natural extension of previous methods to measure the (time-resolved) photoluminescence or time-resolved Kerr rotation signal as a function of the magnetic field strength with a fixed orientation, such a method gives the correct sign of the g factor of electrons in GaAs. Furthermore, the sign of carriers in a (Ga, Mn)As magnetic semiconductor is also found to be negative.
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Received: 22 December 2010
Revised: 17 April 2011
Accepted manuscript online:
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PACS:
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75.40.Gb
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(Dynamic properties?)
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76.50.+g
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(Ferromagnetic, antiferromagnetic, and ferrimagnetic resonances; spin-wave resonance)
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75.90.+w
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(Other topics in magnetic properties and materials)
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78.67.-n
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(Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures)
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Fund: Project supported by the National Basic Research Program of China (Grant No. 2009CB929301) and the National Natural Science
Foundation of China (Grant No. 10911130232). |
Cite this article:
Gu Xiao-Fang(谷晓芳), Qian Xuan(钱轩), Ji Yang(姬扬), Chen Lin(陈林), and Zhao Jian-Hua(赵建华) Determining the sign of g factor via time-resolved Kerr rotation spectroscopy with a rotatable magnetic field 2011 Chin. Phys. B 20 087503
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