Deposition and characterization of YBCO/CeO2/YSZ/CeO2 multilayers on biaxially textured Ni substrates

doi:10.1088/1009-1963/15/2/035

Abstract

Abstract CeO

_{2}

/YSZ/CeO

_{2}

buffer layers were deposited on biaxially textured Ni substrates by pulsed laser deposition. The influence of the processing parameters on the texture development of the seed layer CeO

_{2}

was investigated. Epitaxial films of YBCO were then grown in situ on the CeO

_{2}

/YSZ (yttria-stabilized ZrO

_{2}

)/CeO

_{2}

-buffered Ni substrates. The resulting YBCO conductors exhibited self-field critical current density

J_{c}

of more than 1 MA/cm

^{2}

at 77K and superconducting transition temperature

T_{c}

of about 91K.

Keywords: YBCO films buffer layers pulsed laser deposition biaxially textured Ni substrates

Received: 05 July 2005
Revised: 31 October 2005
Accepted manuscript online:

PACS:	74.78.Fk	(Multilayers, superlattices, heterostructures)
	74.72.Bk
	81.15.Fg	(Pulsed laser ablation deposition)
	68.55.A-	(Nucleation and growth)
	74.25.Sv	(Critical currents)

Fund: Project supported by the State Key Development Program for Basic Research of China (Grant No 2006CB601005).

Cite this article:

"Wang Shu-Fang (王淑芳), Zhao Song-Qing (赵嵩卿), Liu Zhen (刘震), Zhou Yue-Liang (周岳亮), Chen Zheng-Hao (陈正豪), Lü Hui-Bin (吕惠宾), Jin Kui-Juan (金奎娟), Cheng Bo-Lin (程波林), Yang Guo-Zhen (杨国桢) Deposition and characterization of YBCO/CeO₂/YSZ/CeO₂ multilayers on biaxially textured Ni substrates 2006 Chinese Physics 15 444

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Deposition and characterization of YBCO/CeO2/YSZ/CeO2 multilayers on biaxially textured Ni substrates

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Deposition and characterization of YBCO/CeO₂/YSZ/CeO₂ multilayers on biaxially textured Ni substrates