Abstract Rutherford backscattering (RBS) measurements of 4.2 MeV Li and 2.4 MeV He ions were done for YBaCuO and GdBaCuO high-Tc, superconductor films deposited on MgO and SrTiO3 single crystalline substrates and for their bulk samples. Energy spectra of both ions were calculated using the RBS analysis program rewritten by the authors. Comparisons between these two non-destructive tech-niques showed some advantages in analyzing the layer thickness and composition ratios of those thin films by MeV Li ions backscattering. Estimated errors are within 7 % for the measured elemental con-centrations and l0 % for the layer thickness in our experiments. A brief discussion is also made of the results.
Received: 18 March 1992
Accepted manuscript online:
(Rutherford backscattering (RBS), and other methods ofchemical analysis)
Cite this article:
JIANG WEI-LIN (江伟林), ZHENG ZONG-SHUANG (郑宗爽), ZHU PEI-RAN (朱沛然) Li ION BACKSCATTERING STUDY ON HIGH-Tc YBaCuO AND GdBaCuO SUPERCONDUCTOR FILMS 1993 Acta Physica Sinica (Overseas Edition) 2 65
Development of 1.3GHz high-T-c rf SQUID Liu Xin-Yuan (刘新元), Xie Fei-Xiang (谢飞翔), Meng Shu-Chao (孟树超), Dai Yuan-Dong (戴远东), Li Zhuang-Zhi (李壮志), Ma Ping (马平), Yang Tao (杨涛), Nie Rui-Juan (聂瑞娟), Wang Fu-Ren (王福仁), . Chin. Phys. B, 2004, 13(1): 100-104.
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