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Acta Physica Sinica (Overseas Edition), 1998, Vol. 7(12): 912-918    DOI: 10.1088/1004-423X/7/12/005
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Prev   Next  

SIMS STUDY OF OXYGEN SPIRAL DIFFUSION C-TEXTURED Yba2Cu3O7-$\delta$/SrTiO3 EPITAXIAL THIN FILM

CAI ZHEN (蔡震), JIN XUE-JUN (金学军)
Shanghai Institute of Metallurgy, Academia Sinica, Shanghai 200050,China
Abstract  Secondary ion mass spectroscopy was used to study the chemical diffusivity of O18 in c-textured YBa2Cu3O7-$\delta$/SrTiO3 epitaxial thin film. By fitting experimental data to the one- dimensional diffusion curve, the apparent diffusivity along the c-axis was obtained to be equal to l.02×1014cm2/sec when the temperature was 350℃. A computer analysis method was put forward to calculate the "spiral diffusion" process, and the diffusivity anisotopy of films with different mosaic size obtained. For a film of 7000×7000?2 mosaic size, Dab was found to be ~3.55×10-5×exp((-1.03 ev)/kT) cm2/sec. The calculated results reveal that the variation of the results of Dc is not the result of diffusivity anisotropy but of the difference in mosaic size.
Received:  13 January 1998      Revised:  06 May 1998      Accepted manuscript online: 
PACS:  74.72.Bk  
  74.78.Bz  
  74.25.Fy  
  79.20.Rf (Atomic, molecular, and ion beam impact and interactions with surfaces)  

Cite this article: 

CAI ZHEN (蔡震), JIN XUE-JUN (金学军) SIMS STUDY OF OXYGEN SPIRAL DIFFUSION C-TEXTURED Yba2Cu3O7-$\delta$/SrTiO3 EPITAXIAL THIN FILM 1998 Acta Physica Sinica (Overseas Edition) 7 912

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