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Phase escape of current-biased Josephson junctions |
Cao Wen-Hui(曹文会), Yu Hai-Feng(于海峰), Tian Ye(田野), Chen Geng-Hua(陈赓华), and Zhao Shi-Ping(赵士平)† |
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China |
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Abstract Switching current distributions of an Nb/Al--AlOx/Nb Josephson junction are measured in a temperature range from 25 mK to 800 mK. We analyse the phase escape properties by using the theory of Larkin and Ovchinnikov (LO) which takes discrete energy levels into account. Our results show that the phase escape can be well described by the LO approach for temperatures near and below the crossover from thermal activation to macroscopic quantum tunneling. These results are helpful for further study of macroscopic quantum phenomena in Josephson junctions where discrete energy levels need to be considered.
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Received: 25 November 2009
Accepted manuscript online:
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PACS:
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74.50.+r
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(Tunneling phenomena; Josephson effects)
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74.25.Fy
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74.20.-z
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(Theories and models of superconducting state)
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Fund: Project supported by the National
Natural Science Foundation of China (Grant Nos.~10534060 and
10874231) and National Basic Research Program of China (Grant
Nos.~2006CB601007, 2006CB921107, and 2009CB929102). |
Cite this article:
Cao Wen-Hui(曹文会), Yu Hai-Feng(于海峰), Tian Ye(田野), Chen Geng-Hua(陈赓华), and Zhao Shi-Ping(赵士平) Phase escape of current-biased Josephson junctions 2010 Chin. Phys. B 19 067401
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