Abstract We have studied the influence of probe--sample interaction in a scanning near-field optical microscopy (SNOM) in the far field by using samples with a step structure. For a sample with a step height of $\sim \lambda $/4, the SNOM image contrast between the two sides of the step changes periodically at different scan heights. For a step height of $\sim \lambda $/2, the image contrast remains approximately the same. The probe--sample interaction determines the SNOM image contrast here. The influence of different refractive indices of the sample has been also analysed by using a simple theoretical model.
Received: 30 March 2006
Revised: 18 April 2006
Accepted manuscript online:
Fund: Project supported by the
National Natural Science Foundation of China (Grant Nos 90206003,
10374005, 10434020, 10521002, \linebreak
\makebox[1.6mm]{}10328407 and 90101027) and the Research Fund
for the Doctoral Program of Higher Education of China (Grant No
20040001012).
Cite this article:
Li Zhi(李智), Zhang Jia-Sen(张家森), Yang Jing(杨景), and Gong Qi-Huang(龚旗煌) Influence of the probe--sample interaction on scanning near-field optical microscopic images in the far field 2006 Chinese Physics 15 2558
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