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Chinese Physics, 2006, Vol. 15(11): 2558-2563    DOI: 10.1088/1009-1963/15/11/017
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Influence of the probe--sample interaction on scanning near-field optical microscopic images in the far field

Li Zhi(李智), Zhang Jia-Sen(张家森), Yang Jing(杨景), and Gong Qi-Huang(龚旗煌)
Department of Physics and State Key Laboratory for Mesoscopic Physics, Peking University, Beijing 100871, China
Abstract  We have studied the influence of probe--sample interaction in a scanning near-field optical microscopy (SNOM) in the far field by using samples with a step structure. For a sample with a step height of $\sim \lambda $/4, the SNOM image contrast between the two sides of the step changes periodically at different scan heights. For a step height of $\sim \lambda $/2, the image contrast remains approximately the same. The probe--sample interaction determines the SNOM image contrast here. The influence of different refractive indices of the sample has been also analysed by using a simple theoretical model.
Keywords:  SNOM      probe--sample interaction      near-field scanning optical microscopy  
Received:  30 March 2006      Revised:  18 April 2006      Accepted manuscript online: 
PACS:  68.37.Uv (Near-field scanning microscopy and spectroscopy)  
  78.20.Ci (Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity))  
Fund: Project supported by the National Natural Science Foundation of China (Grant Nos 90206003, 10374005, 10434020, 10521002, \linebreak \makebox[1.6mm]{}10328407 and 90101027) and the Research Fund for the Doctoral Program of Higher Education of China (Grant No 20040001012).

Cite this article: 

Li Zhi(李智), Zhang Jia-Sen(张家森), Yang Jing(杨景), and Gong Qi-Huang(龚旗煌) Influence of the probe--sample interaction on scanning near-field optical microscopic images in the far field 2006 Chinese Physics 15 2558

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