中国物理B ›› 2011, Vol. 20 ›› Issue (12): 127303-127303.doi: 10.1088/1674-1056/20/12/127303

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Research on the electrical characteristics of an organic thin-film field-effect transistor based on alternating-current resistance

徐征1, 赵谡玲1, 尹飞飞1, 陈跃宁2, 张成文3, 焦碧媛3, 董宇航3   

  1. (1)Institute of Optoelectronics Technology, Beijing Jiaotong University, Beijing 100044, China;Key Laboratory of Luminescence and Optical Information of the Ministry of Education, Beijing Jiaotong University, Beijing 100044, China; (2)Institute of Optoelectronics Technology, Beijing Jiaotong University, Beijing 100044, China;Key Laboratory of Luminescence and Optical Information of the Ministry of Education, Beijing Jiaotong University, Beijing 100044, China;Physics Department, Liaonin; (3)Physics Department, Liaoning University, Shenyang 110036, China
  • 收稿日期:2010-12-24 修回日期:2011-03-09 出版日期:2011-12-15 发布日期:2011-12-15
  • 基金资助:
    Project supported by the National Grand Fundamental Research 973 Program of China (Grant No. 2010CB327704), the National Natural Science Foundation of China (Grant Nos. 10974013 and 60978060), the Specialized Research Fund for the Doctoral Program of Higher Education of China (Grant No. 20090009110027), the Natural Science Foundation of Beijing, China (Grant No. 1102028), the National Natural Science Foundation for Distinguished Young Scholars (Grant No. 60825407), and Beijing Municipal Science and Technology Commission (Grant No. Z090803044009001).

Research on the electrical characteristics of an organic thin-film field-effect transistor based on alternating-current resistance

Chen Yue-Ning(陈跃宁)a)b)c), Xu Zheng(徐征) a)b)†, Zhao Su-Ling(赵谡玲)a)b), Yin Fei-Fei(尹飞飞)a)b), Zhang Cheng-Wen(张成文) c), Jiao Bi-Yuan(焦碧媛)c), and Dong Yu-Hang (董宇航) c)   

  1. a Institute of Optoelectronics Technology, Beijing Jiaotong University, Beijing 100044, ChinaKey Laboratory of Luminescence and Optical Information of the Ministry of Education, Beijing Jiaotong University, Beijing 100044, China; c Physics Department, Liaoning University, Shenyang 110036, China
  • Received:2010-12-24 Revised:2011-03-09 Online:2011-12-15 Published:2011-12-15
  • Supported by:
    Project supported by the National Grand Fundamental Research 973 Program of China (Grant No. 2010CB327704), the National Natural Science Foundation of China (Grant Nos. 10974013 and 60978060), the Specialized Research Fund for the Doctoral Program of Higher Education of China (Grant No. 20090009110027), the Natural Science Foundation of Beijing, China (Grant No. 1102028), the National Natural Science Foundation for Distinguished Young Scholars (Grant No. 60825407), and Beijing Municipal Science and Technology Commission (Grant No. Z090803044009001).

摘要: In this article, an organic thin-film field-effect transistor (OTFFET) with top-gate and bottom-contact geometry based on pentacene as the active layer is fabricated. The experimental data of the I-V are obtained from the OTFFET device. The alternating-current (AC) resistance value of the OTFFET device is calculated using the derivation method from the experimental data, and the AC resistance trend curves of the OTFFET device are obtained with the region fitting method. We analyse the characteristics of the OTFFET device with an AC resistance trend curve. To discover whether it has a high resistance, it is proposed to judge the region of the source/drain voltage (VDS) less than the transition voltage, thereby determining whether the contact between the metal electrode and the organic semiconductor layer of the OTFFET device is Ohmic or non-Ohmic. The theoretical analysis shows that the field-effect mobility and the AC resistance are in reverse proportion. Therefore, we point out that reducing AC resistance is necessary if field-effect mobility is to be improved.

关键词: organic thin-film field-effect transistor, alternating-current resistance, Ohmic contact

Abstract: In this article, an organic thin-film field-effect transistor (OTFFET) with top-gate and bottom-contact geometry based on pentacene as the active layer is fabricated. The experimental data of the I-V are obtained from the OTFFET device. The alternating-current (AC) resistance value of the OTFFET device is calculated using the derivation method from the experimental data, and the AC resistance trend curves of the OTFFET device are obtained with the region fitting method. We analyse the characteristics of the OTFFET device with an AC resistance trend curve. To discover whether it has a high resistance, it is proposed to judge the region of the source/drain voltage (VDS) less than the transition voltage, thereby determining whether the contact between the metal electrode and the organic semiconductor layer of the OTFFET device is Ohmic or non-Ohmic. The theoretical analysis shows that the field-effect mobility and the AC resistance are in reverse proportion. Therefore, we point out that reducing AC resistance is necessary if field-effect mobility is to be improved.

Key words: organic thin-film field-effect transistor, alternating-current resistance, Ohmic contact

中图分类号:  (Contact resistance, contact potential)

  • 73.40.Cg
73.40.Rw (Metal-insulator-metal structures) 73.61.Ph (Polymers; organic compounds)