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Chin. Phys. B, 2014, Vol. 23(11): 114601    DOI: 10.1088/1674-1056/23/11/114601
ELECTROMAGNETISM, OPTICS, ACOUSTICS, HEAT TRANSFER, CLASSICAL MECHANICS, AND FLUID DYNAMICS Prev   Next  

A new model for film bulk acoustic wave resonators

Li Yu-Jin (李玉金), Yuan Xiu-Hua (元秀华)
School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China
Abstract  

Based on cavity resonance and sandwich composite plate theory, this paper presents a universal three-dimensional (3D) theoretical model for frequency dispersion characterization and displacement profile shapes of the film bulk acoustic resonator (FBARs). This model provides results of FBAR excited thickness-extensional and flexure modes, and the result of frequency dispersion is proposed in which the thicknesses and impedance of the electrodes and the piezoelectric material are taken into consideration; its further simplification shows good agreement with the modified Butterworth-Van-Dyke (MBVD) model. The displacement profile reflects the vibration stress distribution of electrode shapes and the lateral resonance effect, which depends on the axis ratio of the electrode shapes a/b. The results are consistent with the 3D finite element method modeling and laser interferometry measurement in general.

Keywords:  film bulk acoustic wave resonators      acoustic field vibration      cavity resonance      piezoelectric composite  
Received:  05 March 2014      Revised:  12 July 2014      Accepted manuscript online: 
PACS:  46.40.-f (Vibrations and mechanical waves)  
  68.60.Bs (Mechanical and acoustical properties)  
  62.25.Jk (Mechanical modes of vibration)  
Fund: 

Project supported by the National Natural Science Foundation of China (Grant No. 61275081).

Corresponding Authors:  Yuan Xiu-Hua     E-mail:  yuanxh@hust.edu.cn

Cite this article: 

Li Yu-Jin (李玉金), Yuan Xiu-Hua (元秀华) A new model for film bulk acoustic wave resonators 2014 Chin. Phys. B 23 114601

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