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Chin. Phys. B, 2012, Vol. 21(8): 088104    DOI: 10.1088/1674-1056/21/8/088104
INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY Prev   Next  

Low-voltage antimony-doped SnO2 nanowire transparent transistors gated by microporous SiO2-based proton conductors

Xuan Rui-Jie (轩瑞杰), Liu Hui-Xuan (刘慧宣 )
Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, Hunan University, Changsha 410082, China
Abstract  A battery drivable low-voltage transparent lightly antimony(Sb)-doped SnO2 nanowire electric-double-layer (EDL) field-effect transistor (FET) is fabricated on an ITO glass substrate at room temperature. An ultralow operation voltage of 1 V is obtained on account of untralarge specific gate capacitance (~ 2.14 μF/cm2) directly bound up with mobile ions-induced EDL (sandwiched between top electrode and bottom electrode) effect. The transparent FET shows excellent electric characteristics with a field-effect mobility of 54.43 cm2/V·s, current on/off ration of 2× 104, and subthreshold gate voltage swing (S=d Vgs/d(log Ids)) of 140 mV/decade. The threshold voltage Vth (0.1 V) is estimated which indicates that SnO2 namowire transistor operates in an n-type enhanced mode. Such a low-voltage transparent nanowire transistor gated by microporous SiO2-based solid electrolyte is very promising for battery-powered portable nanoscale sensor.
Keywords:  electric double layer      proton conductor      solid electrolytes      nanowire transistors  
Received:  16 January 2012      Revised:  25 April 2012      Accepted manuscript online: 
PACS:  81.07.Gf (Nanowires)  
  72.80.Ey (III-V and II-VI semiconductors)  
  73.40.Qv (Metal-insulator-semiconductor structures (including semiconductor-to-insulator))  
Fund: Project supported by the National Natural Science Foundation of China (Grant No. 10874042).
Corresponding Authors:  Xuan Rui-Jie     E-mail:  xuanruijie1988@126.com

Cite this article: 

Xuan Rui-Jie (轩瑞杰), Liu Hui-Xuan (刘慧宣 ) Low-voltage antimony-doped SnO2 nanowire transparent transistors gated by microporous SiO2-based proton conductors 2012 Chin. Phys. B 21 088104

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