Measurement of inner surface roughness of capillary by an x-ray reflectivity method

doi:10.1088/1674-1056/20/4/040702

Abstract The inner surface roughness of a capillary is investigated by the reflectivity of x-rays penetrating through the capillary. The results are consistent with the data from atomic force microscope (AFM). The roughness measured by this new method can reach the order of angstroms with high quality capillaries.

Keywords: inner surface roughness reflectivity method capillary

Received: 31 December 2010
Revised: 04 January 2011
Accepted manuscript online:

PACS:

07.85.-m

(X- and γ-ray instruments)

Fund: Project supported by the Natural Science Foundation of Beijing, China (Grant No. 1102019) and the Specialized Research Fund for the Doctoral Program of Higher Education of China (Grant No. 20100003120010).

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Li Yu-De(李玉德),Lin Xiao-Yan(林晓燕),Tan Zhi-Yuan(谭植元), Sun Tian-Xi(孙天希),and Liu Zhi-Guo(刘志国) Measurement of inner surface roughness of capillary by an x-ray reflectivity method 2011 Chin. Phys. B 20 040702

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Measurement of inner surface roughness of capillary by an x-ray reflectivity method

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