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Chin. Phys. B, 2015, Vol. 24(7): 076803    DOI: 10.1088/1674-1056/24/7/076803

New method for fast morphological characterization of organic polycrystalline films by polarized optical microscopy

He Xiao-Chuana, Yang Jian-Bingb, Yan Dong-Hangb, Weng Yu-Xianga
a Laboratory of Soft Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
b State Key Laboratory of Polymer Physics and Chemistry, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022, China

A new method to visualize the large-scale crystal grain morphology of organic polycrystalline films is proposed. First, optical anisotropic transmittance images of polycrystalline zinc phthalocyanine (ZnPc) films vacuum deposited by weak epitaxial growth (WEG) method were acquired with polarized optical microscopy (POM). Then morphology properties including crystal grain size, distribution, relative orientation, and crystallinity were derived from these images by fitting with a transition dipole model. At last, atomic force microscopy (AFM) imaging was carried out to confirm the fitting and serve as absolute references. This method can be readily generalized to other organic polycrystalline films, thus providing an efficient way to access the large-scale morphologic properties of organic polycrystalline films, which may prove to be useful in industry as a film quality monitoring method.

Keywords:  organic polycrystalline films      morphology characterization      polarized optical microscopy     
Received:  12 February 2015      Published:  05 July 2015
PACS:  68.55.J- (Morphology of films)  
  42.70.Jk (Polymers and organics)  
  68.37.-d (Microscopy of surfaces, interfaces, and thin films)  

Project supported by the National Natural Science Foundation of China (Grant No. 20933010) and the National Basic Research Program of China (Grant No. 2013CB834800).

Corresponding Authors:  Weng Yu-Xiang     E-mail:

Cite this article: 

He Xiao-Chuan, Yang Jian-Bing, Yan Dong-Hang, Weng Yu-Xiang New method for fast morphological characterization of organic polycrystalline films by polarized optical microscopy 2015 Chin. Phys. B 24 076803

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