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Other articles related with "interface quality"：
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38101 |
Da-Ping Liu(刘大平), Xiao-Bo Li(李小波), Tao-Fei Pu(蒲涛飞), Liu-An Li(李柳暗), Shao-Heng Cheng(成绍恒), and Qi-Liang Wang(王启亮) |
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Vertical GaN Shottky barrier diode with thermally stable TiN anode |
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Chin. Phys. B
2021 Vol.30 (3): 38101-
[Abstract]
(464)
[HTML 1 KB]
[PDF 1698 KB]
(116)
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127703 |
Lin Zhou(周琳), Lu Liu(刘璐), Yu-Heng Deng(邓煜恒), Chun-Xia Li(李春霞), Jing-Ping Xu(徐静平) |
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Improved interfacial properties of HfGdON gate dielectric Ge MOS capacitor by optimizing Gd content |
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Chin. Phys. B
2019 Vol.28 (12): 127703-127703
[Abstract]
(483)
[HTML 1 KB]
[PDF 1950 KB]
(121)
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