Other articles related with "PHEMT":
88504 Xiao-Wen Xi(席晓文), Chang-Chun Chai(柴常春), Yang Liu(刘阳), Yin-Tang Yang(杨银堂), Qing-Yang Fan(樊庆扬), Chun-Lei Shi(史春蕾)
  Analysis of the damage threshold of the GaAs pseudomorphic high electron mobility transistor induced by the electromagnetic pulse
    Chin. Phys. B   2016 Vol.25 (8): 88504-088504 [Abstract] (607) [HTML 1 KB] [PDF 1356 KB] (392)
67306 Li-Shu Wu(吴立枢), Yan Zhao(赵岩), Hong-Chang Shen(沈宏昌) You-Tao Zhang(张有涛), Tang-Sheng Chen(陈堂胜)
  Heterogeneous integration of GaAs pHEMT and Si CMOS on the same chip
    Chin. Phys. B   2016 Vol.25 (6): 67306-067306 [Abstract] (754) [HTML 1 KB] [PDF 1284 KB] (322)
48503 Xiao-Wen Xi(席晓文), Chang-Chun Chai(柴常春), Gang Zhao(赵刚), Yin-Tang Yang(杨银堂), Xin-Hai Yu(于新海), Yang Liu(刘阳)
  Damage effect and mechanism of the GaAs pseudomorphic high electron mobility transistor induced by the electromagnetic pulse
    Chin. Phys. B   2016 Vol.25 (4): 48503-048503 [Abstract] (766) [HTML 1 KB] [PDF 1762 KB] (435)
48502 Yu Xin-Hai (于新海), Chai Chang-Chun (柴常春), Liu Yang (刘阳), Yang Yin-Tang (杨银堂), Xi Xiao-Wen (席晓文)
  Simulation and experimental study of high power microwave damage effect on AlGaAs/InGaAs pseudomorphic high electron mobility transistor
    Chin. Phys. B   2015 Vol.24 (4): 48502-048502 [Abstract] (732) [HTML 0 KB] [PDF 556 KB] (398)
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