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X-ray phase-sensitive microscope imaging with a grating interferometer: Theory and simulation |
| Jiecheng Yang(杨杰成)1, Peiping Zhu(朱佩平)2,3,†, Dong Liang(梁栋)1,4, Hairong Zheng(郑海荣)4, and Yongshuai Ge(葛永帅)1,4,‡ |
1 Research Center for Medical Artificial Intelligence, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China;
2 Platform of Advanced Photon Source Technology R&D, Laboratory of X-ray Optics and Technology, Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, 100049, China;
3 Beijing Advanced Innovation Center for Imaging Theory and Technology, Capital Normal University, Beijing 100048, China;
4 Paul C Lauterbur Research Center for Biomedical Imaging, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China |
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Abstract A general theoretical framework is presented to explain the formation of the phase signal in an x-ray microscope integrated with a grating interferometer, which simultaneously enables the high spatial resolution imaging and the improved image contrast. By using this theory, several key parameters of phase contrast imaging can be predicted, for instance, the fringe visibility and period, and the conversion condition from the differential phase imaging (DPI) to the phase difference imaging (PDI). Additionally, numerical simulations are performed with certain x-ray optical components and imaging geometry. Comparison with the available experimental measurement [Appl. Phys. Lett. 113 063105 (2018)] demonstrates the accuracy of this developed quantitative analysis method of x-ray phase-sensitive microscope imaging.
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Received: 29 December 2021
Revised: 10 March 2022
Accepted manuscript online: 23 March 2022
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| Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 12027812 and 11804356) and the Youth Innovation Promotion Association of the Chinese Academy of Sciences (Grant No. 2021362). |
Corresponding Authors:
Peiping Zhu, Yongshuai Ge
E-mail: zhupp@ihep.ac.cn;ys.ge@siat.ac.cn
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Cite this article:
Jiecheng Yang(杨杰成), Peiping Zhu(朱佩平), Dong Liang(梁栋), Hairong Zheng(郑海荣), and Yongshuai Ge(葛永帅) X-ray phase-sensitive microscope imaging with a grating interferometer: Theory and simulation 2022 Chin. Phys. B 31 098702
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