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Chin. Phys. B, 2012, Vol. 21(7): 076104    DOI: 10.1088/1674-1056/21/7/076104
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Prev   Next  

A nano-metallic-particles-based CMOS image sensor for DNA detection

He Jin(何进)a), Su Yan-Mei(苏艳梅)b), Ma Yu-Tao (马玉涛)b), Chen Qin(陈沁)b), Wang Ruo-Nan(王若楠) b), Ye Yun(叶韵)b), Ma Yong(马勇) b), and Liang Hai-Lang(梁海浪)b)
a Micro & Nano Electronic Device and Integrated Technology Center, School of Electronics Engineering and Computer Science, Peking University, Beijing 100871, China;
b Peking University Shenzhen SOC Key Laboratory, PKU-HKUST Shenzhen-Honggang Institution, W303, West Tower, IER Bldg., Hi-Tech Industrial Park South, Shenzhen 518057, China
Abstract  In this paper we report on a study of the CMOS image sensor detection of the DNA based on the self-assembled nano-metallic particles, which are selectively deposited on the surface of passive image sensor. The nano-metallic particles block the optical radiation in the visible spectrum of ordinary light source effectively. When such a technical method is applied to the DNA detection, the requirement for special UV light source in the most popular fluorescence is eliminated. The DNA detection methodology is tested on a CMOS sensor chip fabricated using a standard 0.5 μm CMOS process. It is demonstrated that the approach is highly selective to detecting even signal-base mismatched DNA target with extremely-low-concentration DNA sample down to 10 pM under ordinary light source.
Keywords:  CMOS image sensor      nano-metallic particles      DNA detection      0.5 μm CMOS process  
Received:  25 August 2011      Revised:  18 January 2012      Accepted manuscript online: 
PACS:  61.82.Fk (Semiconductors)  
  64.70.kg (Semiconductors)  
  68.35.bg (Semiconductors)  
Fund: Project supported by the Key Program of the National Natural Science Foundation of China (Grant No. 61036004), the Shenzhen Science & Technology Foundation, China (Grant No. CXB201005250031A), the Fundamental Research Project of Shenzhen Science & Technology Foundation, China (Grant No. JC201005280670A), and the International Collaboration Project of Shenzhen Science & Technology Foundation, China (Grant No. ZYA2010006030006A).
Corresponding Authors:  He Jin     E-mail:  frankhe@pku.edu.cn

Cite this article: 

He Jin(何进), Su Yan-Mei(苏艳梅), Ma Yu-Tao (马玉涛), Chen Qin(陈沁), Wang Ruo-Nan(王若楠), Ye Yun(叶韵), Ma Yong(马勇), and Liang Hai-Lang(梁海浪) A nano-metallic-particles-based CMOS image sensor for DNA detection 2012 Chin. Phys. B 21 076104

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