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Chinese Physics, 2006, Vol. 15(5): 1081-1085    DOI: 10.1088/1009-1963/15/5/036
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Prev   Next  

Critical properties of XY model on two-dimensional layered magnetic films

Wang Yi (王 漪), Liu Xiao-Yan (刘晓彦), Sun Lei (孙 雷), Zhang Xing (张 兴), Han Ru-Qi (韩汝琦)
Institute of Microelectronics, Peking University, Beijing 100871, China
Abstract  Using Monte Carlo simulations, we have investigated the classical $XY$ model on triangular lattices of ultra-thin film structures with middle ferromagnetic layers sandwiched between two antiferromagnetic layers. The internal energy, the specific heat, the chirality and the chiral susceptibility are calculated in order to clarify phase transitions and critical phenomena. From the finite-size scaling analyses, the values of critical exponents are determined. In a range of interaction parameters, we find that the chirality steeply goes up as temperature increases in a temperature range; correspondingly the value of a critical exponent for this change is estimated.
Keywords:  layered XY model      critical phenomena      ultra-thin magnetic film  
Received:  17 October 2005      Revised:  27 February 2006      Accepted manuscript online: 
PACS:  75.10.Hk (Classical spin models)  
  68.55.-a (Thin film structure and morphology)  
  75.30.Kz (Magnetic phase boundaries (including classical and quantum magnetic transitions, metamagnetism, etc.))  
  75.40.Cx (Static properties (order parameter, static susceptibility, heat capacities, critical exponents, etc.))  
  75.70.Ak (Magnetic properties of monolayers and thin films)  
Fund: Project supported by the National Natural Science Foundation of China (Grant No 10234010).

Cite this article: 

Wang Yi (王 漪), Liu Xiao-Yan (刘晓彦), Sun Lei (孙 雷), Zhang Xing (张 兴), Han Ru-Qi (韩汝琦) Critical properties of XY model on two-dimensional layered magnetic films 2006 Chinese Physics 15 1081

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