Please wait a minute...
Chin. Phys. B, 2015, Vol. 24(1): 010601    DOI: 10.1088/1674-1056/24/1/010601
REVIEW Prev   Next  

Progress on accurate measurement of the Planck constant: Watt balance and counting atoms

Li Shi-Song (李世松)a b, Zhang Zhong-Hua (张钟华)b, Zhao Wei (赵伟)a, Li Zheng-Kun (李正坤)b, Huang Song-Ling (黄松岭)a
a Department of Electrical Engineering, Tsinghua University, Beijing 100084, China;
b National Institute of Metrology, Beijing 100029, China
Abstract  

The Planck constant h is one of the most significant constants in quantum physics. Recently, the precision measurement of the value of h has been a hot issue due to its important role for the establishment of both a new SI and a revised fundamental physical constant system. Up to date, two approaches, the watt balance and counting atoms, have been employed to determine the Planck constant at a level of several parts in 108. In this paper, the principle and progress on precision measurement of the Planck constant using watt balance and counting atoms at national metrology institutes are reviewed. Further improvement in determining the Planck constant and possible developments of a revised physical constant system in future are discussed.

Keywords:  Planck constant      watt balance      silicon sphere      Avogadro constant  
Received:  03 August 2014      Revised:  05 September 2014      Accepted manuscript online: 
PACS:  06.20.-f (Metrology)  
  06.20.Jr (Determination of fundamental constants)  
  07.05.Fb (Design of experiments)  
  07.10.Pz (Instruments for strain, force, and torque)  
Fund: 

Project supported by the National Natural Science Foundation of China (Grant No. 51477160), the National Department Public Benefit Research Foundation of China (Grant No. 201010010), and the National Key Technology R&D Program of China (Grant No. 2006BAF06B01).

Corresponding Authors:  Li Shi-Song, Zhang Zhong-Hua     E-mail:  leeshisong@sina.com;zzh@nim.ac.cn

Cite this article: 

Li Shi-Song (李世松), Zhang Zhong-Hua (张钟华), Zhao Wei (赵伟), Li Zheng-Kun (李正坤), Huang Song-Ling (黄松岭) Progress on accurate measurement of the Planck constant: Watt balance and counting atoms 2015 Chin. Phys. B 24 010601

[1] Planck M 1901 Ann. Phys. 309 553
[2] Klitzing K, Dorda G and Pepper M 1980 Phys. Rev. Lett. 45 494
[3] Josephson B D 1962 Phys. Lett. 1 251
[4] Steiner R 2013 Rep. Prog. Phys. 76 016101
[5] Mills I M, Mohr P J, Quinn T J, Taylor B N and Williams E R 2006 Metrologia 43 227
[6] Davis R S and Milton M J T 2014 Metrologia 51 169
[7] Giovannetti V, Lloyd S and Maccone L 2006 Phys. Rev. Lett. 96 010401
[8] Xiang G Y and Guo G C 2013 Chin. Phys. B 22 110601
[9] Hinkley N, Sherman J A, Phillips N B, Schioppo M, Lemke N D, Beloy K, Pizzocaro M, Oates C W and Ludlow A D 2013 Science 341 1215
[10] Chao Y, Gao L X and Wang Z S 2010 Chin. Phys. B 19 054101
[11] Bi Y M, Liao M, Zhang P and Ma G 2013 Acta Phys. Sin. 62 159301 (in Chinese)
[12] Zhang H L, Hu B J and Zhang X Y 2012 Chin. Phys. B 21 027701
[13] Novoselov K S, McCann E, Morozov S V, Fal'ko V I, Katsnelson M I, Zeitler U, Jiang D, Schedin F and Geim A K 2006 Nat. Phys. 2 177
[14] Benz S P and Hamilton C A 1996 Appl. Phys. Lett. 68 3171
[15] Taylor B N and Witt T J 1989 Metrologia 26 47
[16] Girard G 1994 Metrologia 31 317
[17] Mills I M, Mohr P J, Quinn T J, Taylor B N and Williams E R 2011 Phil. Trans. R. Soc. A 369 3907
[18] Bordé C J 2005 Phil. Trans. R. Soc. A 363 2177
[19] Milton M J T, Davis R and Fletcher N 2014 Metrologia 51 R21
[20] Mohr P J, Taylor B N and Newell D B 2012 J. Phys. Chem. Ref. Data 41 043109
[21] Li S, Han B, Li Z, et al. 2012 Measurement 45 1
[22] Jones N 2012 Nature 481 14
[23] Vigoureux P 1965 Metrologia 1 3
[24] Sienknecht V and Funck T 1986 Metrologia 22 209
[25] Bower V E and Davis R S 1980 J. Res. Natl. Bur. Stand. 85 175
[26] Kibble B P 1976 Atomic Masses and Fundamental Constants (5th edn.) (US: Springer) pp. 545-551
[27] Eichenberger A, Geneves G and Gournay P 2009 Eur. Phys. J. Spec. Top. 172 363
[28] Stock M 2013 Metrologia 50 R1
[29] Andreas B, Azuma Y, Bartl G, et al. 2011 Phys. Rev. Lett. 106 030801
[30] Bettin H, Fujii K, Man J, et al. 2013 Ann. Phys. 525 680
[31] Mana G and Massa E 2012 Riv. Nuovo. Cimento. 35 1
[32] Quinn T J 1992 Meas. Sci. Technol. 3 141
[33] Poli N, Wang F Y, Tarallo M G, et al. 2011 Phys. Rev. Lett. 106 038501
[34] Williams E R, Steiner R L, Newell D B, et al. 1998 Phys. Rev. Lett. 81 2404
[35] Becker P 2001 Rep. Prog. Phys. 64 1945
[36] Becker P, Bettin H, Danzebrink H U, et al. 2003 Metrologia 40 271
[37] Becker P, Schiel D, Pohl H J, et al. 2006 Meas. Sci. Technol. 17 1854
[38] Mana G, Rienitz O and Pramann A 2010 Metrologia 47 460
[39] Massa E, Mana G, Kuetgens U, et al. 2011 Metrologia 48 S37
[40] Picard A, Barat P, Borys M, et al. 2011 Metrologia 48 S112
[41] Bartl G, Bettin H, Krystek M, et al. 2011 Metrologia 48 S96
[42] Petley B W, Kibble B P and Hartland A 1987 Nature 327 605
[43] Kibble B P, Robinson I A and Belliss J H 1990 Metrologia 27 173
[44] Robinson I A and Kibble B P 1997 IEEE Trans. Instrum. Meas. 46 596
[45] Robinson I A and Kibble B P 2007 Metrologia 44 427
[46] Robinson I A 2012 Metrologia 49 113
[47] Steele A G, Meija J, Sanchez C A, et al. 2012 Metrologia 49 L8
[48] Sanchez C A, Wood B M, Green R G, et al. 2014 Metrologia 51 5
[49] Olsen P T, Phillips W D and Williams E R 1980 J. Res. Natl. Bur. Stand. 85 257
[50] Olsen P T, Bower V E, Phillips W D, et al. 1985 IEEE Trans. Instrum. Meas. 34 175
[51] Cage M E, Dziuba R F, Elmquist R E, et al. 1989 IEEE Trans. Instrum. Meas. 38 284
[52] Steiner R L, Williams E R, Newell D B, et al. 2005 Metrologia 42 431
[53] Steiner R L, Williams E R, Liu R, et al. 2007 IEEE Trans. Instrum. Meas. 56 592
[54] Schlamminger S, Haddad D, Seifert F, et al. 2014 Metrologia 51 S15
[55] Seifert F, Panna A, Li S, et al. 2014 arXiv:1405.1450
[56] Beer W, Jeanneret B, Jeckelmann B, et al. 1999 IEEE Trans. Instrum. Meas. 48 192
[57] Beer W, Eichenberger A L, Jeanneret B, et al. 2001 IEEE Trans. Instrum. Meas. 50 583
[58] Beer W, Eichenberger A L, Jeanneret B, et al. 2003 IEEE Trans. Instrum. Meas. 52 626
[59] Eichenberger A, Baumann H, Jeanneret B, et al. 2011 Metrologia 48 133
[60] Baumann H, Eichenberger A, Cosandier F, et al. 2013 Metrologia 50 235
[61] Cosandier F, Eichenberger A, Baumann H, et al. 2014 Metrologia 51 S88
[62] Genevès G, Gournay P, Gosset A, et al. 2005 IEEE Trans. Instrum. Meas. 54 850
[63] Villar F, David J and Genevès G 2011 Precis. Eng. 35 693
[64] Gournay P, Genevès G, Alves F, et al. 2005 IEEE Trans. Instrum. Meas. 54 742
[65] Topcu S, Chassagne L, Haddad D, et al. 2004 Rev. Sci. Instrum. 75 4824
[66] Haddad D, Juncar P, Geneves G, et al. 2009 IEEE Trans. Instrum. Meas. 58 1003
[67] Merlet S, Kopaev A, Diament M, et al. 2008 Metrologia 45 265
[68] Merlet S, Bodart Q, Malossi N, et al. 2010 Metrologia 47 L9
[69] Gillot P, Francis O, Landragin A, et al. 2014 Metrologia 51 L15
[70] Thomas M, Espel P, Briand Y, et al. 2014 Metrologia 51 S54
[71] Picard A, Stock M, Fang H, et al. 2007 IEEE Trans. Instrum. Meas. 56 538
[72] de Mirandés E, Zeggagh A, Bradley M P, et al. 2014 Metrologia 51 123
[73] Robinson I A 2012 Metrologia 49 108
[74] Fang H, Kiss A, de Mirandes E, et al. 2013 IEEE Trans. Instrum. Meas. 62 1491
[75] Sutton C M and Clarkson M T 2014 Metrologia 51 101
[76] Kim D, Woo B C, Lee K C, et al. 2014 Metrologia 51 S96
[77] Zhang Z, He Q, Li Z, et al. 2011 IEEE Trans. Instrum. Meas. 60 2533
[78] Yang H, Lu Y, Hu P, et al. 2014 Meas. Sci. Technol. 25 064003
[79] Li Z, Zhang Z, He Q, et al. 2011 IEEE Trans. Instrum. Meas. 60 2292
[80] Lan J, Zhang Z, Li Z, et al. 2012 IEEE Trans. Instrum. Meas. 61 2524
[81] Zhang Z H, He Q, Li Z K, Han B, Lu Y F, Lan J, Li C, Li S S, Xu J X, Wang N, Wang G and Gong H Z 2014 Metrologia 51 S25
[82] Sutton C M and Fitzgerald M P 2009 Metrologia 46 655
[83] Sutton C M 2009 Metrologia 46 467
[84] Andreas B, Azuma Y, Bartl G, et al. 2011 Metrologia 48 S1
[85] Valkiers S, Mana G, Fujii K, et al. 2011 Metrologia 48 S26
[86] Becker P, Schiel D, Pohl H J, et al. 2006 Meas. Sci. Technol. 17 1854
[87] Pramann A, Rienitz O, Schiel D, et al. 2011 Metrologia 48 S20
[88] Drozdov M N, Drozdov Y N, Pryakhin D A, et al. 2010 B. Russ. Acad. Sci. Phys. 74 75
[89] Bulska E, Drozdov M N, Mana G, et al. 2011 Metrologia 48 S32
[90] Narukawa, Tomohiro, et al. 2014 Metrologia 51 161
[91] Vocke Jr R D, Rabb S A and Turk G C 2014 Metrologia 51 361
[92] Deslattes R D and Henins A 1973 Phys. Rev. Lett. 31 972
[93] Becker P, Dorenwendt K, Ebeling G, et al. 1981 Phys. Rev. Lett. 46 1540
[94] Becker P, Cavagnero G, Kuetgens U, et al. 2007 IEEE Trans. Instrum. Meas. 56 230
[95] Cavagnero G, Fujimoto H, Mana G, et al. 2004 Metrologia 41 56
[96] Hanke M and Kessler E G 2005 J. Phys. D: Appl. Phys. 38 A117
[97] Becker P 2003 Metrologia 40 366
[98] Ferroglio L, Mana G and Massa E 2008 Opt. Express 16 16877
[99] Massa E, Mana G, Ferroglio L, et al. 2011 Metrologia 48 S44
[100] Zakel S, Wundrack S, Niemann H, et al. 2011 Metrologia 48 S14
[101] Busch I, Azuma Y, Bettin H, et al. 2011 Metrologia 48 S62
[102] Zhang J T, Wu X J and Li Y 2012 Chin. Phys. B 21 010701
[103] Seah M P, Spencer S J, Bensebaa F, et al. 2004 Surf. Interface Anal. 36 1269
[104] Mizushima S 2004 Metrologia 41 137
[105] Busch I, Danzebrink H U, Krumrey M, et al. 2009 IEEE Trans. Instrum. Meas. 58 891
[106] Saunders J B 1972 J. Res. Natl Bur. Stand 76 11
[107] Sacconi A, Peuto A M, Pasin W, et al. 1989 IEEE Trans. Instrum. Meas. 38 200
[108] Fujii K, Tanaka M, Nezu Y, et al. 1992 Rev. Sci. Instrum. 63 5320
[109] Masui R 1997 Metrologia 34 125
[110] Bartl G and Nicolaus R A 2009 IEEE Trans. Instrum. Meas. 58 919
[111] Zhang J T, Wu X J and Li Y 2011 Chin. Phys. B 20 090601
[112] Giardini W, Manson P, Wouters M, et al. 2009 IEEE Trans. Instrum. Meas. 58 908
[113] Kuramoto N, Fujii K and Yamazawa K 2011 Metrologia 48 S83
[114] Mohr P J, Taylor B N and Newell D B 2008 J. Phys. Chem. Ref. Data 37 1187
[115] Li S, Zhang Z and Han B 2013 Metrologia 50 482
[116] Li S, Schlamminger S and Pratt J 2014 Metrologia 51 394
[117] Sasso C P, Massa E and Mana G 2013 Metrologia 50 164
[118] Quagliotti D and Mana G 2014 Metrologia 51 S72
[119] Kibble B P and Robinson I A 2014 Metrologia 51 S132
[120] Newell D B 2014 Phys. Today 67 35
[1] Mixed polarization in determining the film thickness of a silicon sphere by spectroscopic ellipsometry
Zhang Ji-Tao(张继涛), Wu Xue-Jian(吴学健), and Li Yan(李岩) . Chin. Phys. B, 2012, 21(1): 010701.
[2] Uncertainty reevaluation in determining the volume of a silicon sphere by spherical harmonics in an Avogadro project
Zhang Ji-Tao(张继涛), Wu Xue-Jian(吴学健), and Li Yan(李岩) . Chin. Phys. B, 2011, 20(9): 090601.
No Suggested Reading articles found!