Effect of electromechanical boundary conditions on the properties of epitaxial ferroelectric thin films

doi:10.1088/1674-1056/20/10/107701

Abstract The effects of internal stresses and depolarization fields on the properties of epitaxial ferroelectric perovskite thin films are discussed by employing the dynamic Ginzburg-Landau equation (DGLE). The numerical solution for BaTiO₃ film shows that internal stress and the depolarization field have the most effects on ferroelectric properties such as polarization, Curie temperature and susceptibility. With the increase of the thickness of the film, the polarization of epitaxial ferroelectric thin film is enhanced rapidly under high internal compressively stress. With the thickness exceeding the critical thickness for dislocation formation, the polarization increases slowly and even weakens due to relaxed internal stresses and a weak electrical boundary condition. This indicates that the effects of mechanical and electrical boundary conditions both diminish for ferroelectric thick films. Consequently, our thermodynamic method is a full scale model that can predict the properties of ferroelectric perovskite films in a wide range of film thickness.

Keywords: ferroelectric film internal stresses thermodynamic equations polarizations

Received: 26 April 2011
Revised: 10 June 2011
Accepted manuscript online:

PACS:	77.55.Px	(Epitaxial and superlattice films)
	05.70.-a	(Thermodynamics)
	77.80.bn	(Strain and interface effects)

Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 10802070, 10972188, and 10902055), Natural Science Foundation of Fujian Province of China (Grant No. 2011J01329), and the Fundamental Research Funds for the Central Universities of China (Grant No. 2011121002).

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Zhou Zhi-Dong(周志东), Zhang Chun-Zu(张春祖), and Jiang Quan(蒋泉) Effect of electromechanical boundary conditions on the properties of epitaxial ferroelectric thin films 2011 Chin. Phys. B 20 107701

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