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Chin. Phys. B, 2009, Vol. 18(7): 2868-2872    DOI: 10.1088/1674-1056/18/7/041
CLASSICAL AREAS OF PHENOMENOLOGY Prev   Next  

Application of sampled grating to control the lasing wavelength in complex-coupled DFB laser

Wang Huan(王桓)a)†, Zhu Hong-Liang(朱洪亮)a), Jia Ling-Hui(贾凌慧)b), Chen Xiang-Fei(陈向飞)b), Kong Duan-Hua(孔端花)a), Wang Lie-Song(王列松)a), Zhang Wei(张伟)a), Zhao Ling-Juan(赵玲娟)a), and Wang Wei(王圩)a)
a Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; b Microwave-Photonics Technology Laboratory, Nanjing National Laboratory of Microstructures, Nanjing University, Nanjing 210093, China
Abstract  This paper reports that the complex-coupled distributed feedback laser with the sampled grating has been designed and fabricated. The +1st order reflection of the sampled grating is utilized for laser single mode operation, which is 1.5387 μm in the experiment. The typical threshold current of the device is 30 mA, and the optical output power is about 10 mW at the injection current of 100 mA.
Keywords:  sampled grating      complex-coupled      +1st order mode      distributed feedback laser  
Received:  13 October 2008      Revised:  30 October 2008      Accepted manuscript online: 
PACS:  42.55.-f (Lasers)  
  42.79.Dj (Gratings)  
  68.55.A- (Nucleation and growth)  
  78.66.Fd (III-V semiconductors)  
Fund: Project supported by the National High-Tech Research and Development Programm of China (Grant Nos 2006AA01Z256, 2007AA03Z419 and 2007AA03Z417), the National Key Basic Research Programm of China (Grant Nos 2006CB604901 and 2006CB604902), and the National Natural Science Foundation of China (Grant Nos 90401025, 60736036, 60706009 and 60777021).

Cite this article: 

Wang Huan(王桓), Zhu Hong-Liang(朱洪亮), Jia Ling-Hui(贾凌慧), Chen Xiang-Fei(陈向飞), Kong Duan-Hua(孔端花), Wang Lie-Song(王列松), Zhang Wei(张伟), Zhao Ling-Juan(赵玲娟), and Wang Wei(王圩) Application of sampled grating to control the lasing wavelength in complex-coupled DFB laser 2009 Chin. Phys. B 18 2868

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