中国物理B ›› 2018, Vol. 27 ›› Issue (7): 76101-076101.doi: 10.1088/1674-1056/27/7/076101
• CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES • 上一篇 下一篇
Jie Luo(罗捷), Tie-shan Wang(王铁山), Dong-qing Li(李东青), Tian-qi Liu(刘天奇), Ming-dong Hou(侯明东), You-mei Sun(孙友梅), Jing-lai Duan(段敬来), Hui-jun Yao(姚会军), Kai Xi(习凯), Bing Ye(叶兵), Jie Liu(刘杰)
Jie Luo(罗捷)1,2,3, Tie-shan Wang(王铁山)2, Dong-qing Li(李东青)1, Tian-qi Liu(刘天奇)1, Ming-dong Hou(侯明东)1, You-mei Sun(孙友梅)1, Jing-lai Duan(段敬来)1, Hui-jun Yao(姚会军)1, Kai Xi(习凯)1, Bing Ye(叶兵)1, Jie Liu(刘杰)1
摘要: Heavy-ion flux is an important experimental parameter in the ground based single event tests. The flux impact on a single event effect in different memory devices is analyzed by using GEANT4 and TCAD simulation methods. The transient radial track profile depends not only on the linear energy transfer (LET) of the incident ion, but also on the mass and energy of the ion. For the ions with the energies at the Bragg peaks, the radial charge distribution is wider when the ion LET is larger. The results extracted from the GEANT4 and TCAD simulations, together with detailed analysis of the device structure, are presented to demonstrate phenomena observed in the flux related experiment. The analysis shows that the flux effect conclusions drawn from the experiment are intrinsically connected and all indicate the mechanism that the flux effect stems from multiple ion-induced pulses functioning together and relies exquisitely on the specific response of the device.
中图分类号: (Semiconductors)