中国物理B ›› 2013, Vol. 22 ›› Issue (8): 86102-086102.doi: 10.1088/1674-1056/22/8/086102
• CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES • 上一篇 下一篇
张战刚a b, 刘杰a, 侯明东a, 孙友梅a, 苏弘a, 段敬来a, 莫丹a, 姚会军a, 罗捷a, 古松a b, 耿超a b, 习凯a b
Zhang Zhan-Gang (张战刚)a b, Liu Jie (刘杰)a, Hou Ming-Dong (侯明东)a, Sun You-Mei (孙友梅)a, Su Hong (苏弘)a, Duan Jing-Lai (段敬来)a, Mo Dan (莫丹)a, Yao Hui-Jun (姚会军)a, Luo Jie (罗捷)a, Gu Song (古松)a b, Geng Chao (耿超)a b, Xi Kai (习凯)a b
摘要: Experimental evidence is presented relevant to the angular dependences of multiple-bit upset (MBU) rates and patterns in static random access memories (SRAMs) under heavy ion irradiation. The single event upset (SEU) cross sections under tilted ion strikes are overestimated by 23.9%-84.6%, compared with under normally incident ion with the equivalent linear energy transfer (LET) value of ~ 41 MeV/(mg/cm2), which can be partially explained by the fact that the MBU rate for tilted ions of 30° is 8.5%-9.8% higher than for normally incident ions. While at a lower LET of ~ 9.5 MeV/(mg/cm2), no clear discrepancy is observed. Moreover, since the ion trajectories at normal and tilted incidences are different, the predominant double-bit upset (DBU) patterns measured are different in both conditions. Those differences depend on the LET values of heavy ions and devices under test. Thus, effective LET method should be used carefully in ground-based testing of single event effects (SEE) sensitivity, especially in MBU-sensitive devices.
中图分类号: (Semiconductors)