A double toroidal analyzer for scanning probe electron energy spectrometer

doi:10.1088/1674-1056/23/7/073402

Abstract An ultra-high vacuum (UHV) compatible electron spectrometer employing a double toroidal analyzer has been developed. It is designed to be combined with a custom-made scanning tunneling microscope (STM) to study the spatially localized electron energy spectrum on a surface. A tip-sample system composed of a piezo-driven field-emission tungsten tip and a sample of highly ordered pyrolytic graphite (HOPG) is employed to test the performance of the spectrometer. Two-dimensional images of the energy-resolved and angle-dispersed electrons backscattered from the surface of HOPG are obtained, the performance is optimized and the spectrometer is calibrated. A complete electron energy loss spectrum covering the elastic peak to the secondary electron peaks for the HOPG surface, acquired at a tip voltage of -140 V and a sample current of 0.5 pA, is presented, demonstrating the viability of the spectrometer.

Keywords: double toroidal analyzer scanning probe electron energy spectroscopy electron energy loss spectroscopy secondary electron emission spectroscopy

Received: 26 February 2014
Revised: 26 March 2014
Accepted manuscript online:

PACS:	34.80.-i	(Electron and positron scattering)
	07.50.Ls	(Electrometers)
	68.49.Jk	(Electron scattering from surfaces)

Fund: Project supported by the National Basic Research Program of China (Grant No. 2010CB923301) and the National Natural Science Foundation of China (Grant Nos. 11327404 and 11174268).

Corresponding Authors: Xu Chun-Kai
E-mail: xuck@ustc.edu.cn

About author: 34.80.-i; 07.50.Ls; 68.49.Jk

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Xu Chun-Kai (徐春凯), Zhang Pan-Ke (张盼科), Li Meng (郦盟), Chen Xiang-Jun (陈向军) A double toroidal analyzer for scanning probe electron energy spectrometer 2014 Chin. Phys. B 23 073402

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A double toroidal analyzer for scanning probe electron energy spectrometer

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