Atomic-level quantitative analysis of electronic functional materials by aberration-corrected STEM

Wanbo Qu(曲万博), Zhihao Zhao(赵志昊), Yuxuan Yang(杨宇轩), Yang Zhang(张杨), Shengwu Guo(郭生武), Fei Li(李飞), Xiangdong Ding(丁向东), Jun Sun(孙军), and Haijun Wu(武海军)

Chin. Phys. B . 2024, (11): 116802 -116802 . DOI: 10.1088/1674-1056/ad7afc