Physical mechanism of secondary-electron emission in Si wafers
Yanan Zhao(赵亚楠), Xiangzhao Meng(孟祥兆), Shuting Peng(彭淑婷), Guanghui Miao(苗光辉), Yuqiang Gao(高玉强), Bin Peng(彭斌), Wanzhao Cui(崔万照), and Zhongqiang Hu(胡忠强)
Chin. Phys. B . 2024, (4): 47901 -047901 .  DOI: 10.1088/1674-1056/ad1175