Chinese Physics B
Erratum to “Accurate determination of film thickness by low-angle x-ray reflection”
Ming Xu(徐明), Tao Yang(杨涛), Wenxue Yu(于文学), Ning Yang(杨宁), Cuixiu Liu(刘翠秀), Zhenhong Mai(麦振洪), Wuyan Lai(赖武彦), and Kun Tao(陶琨)
Chin. Phys. B . 2022, (9): 99901 -099901 .  DOI: 10.1088/1674-1056/ac89d3

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