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Other articles related with "trapping behavior":
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37201 |
Tao-Tao Que(阙陶陶), Ya-Wen Zhao(赵亚文), Liu-An Li(李柳暗), Liang He(何亮), Qiu-Ling Qiu(丘秋凌), Zhen-Xing Liu(刘振兴), Jin-Wei Zhang(张津玮), Jia Chen(陈佳), Zhi-Sheng Wu(吴志盛), Yang Liu(刘扬) |
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Effect of overdrive voltage on PBTI trapping behavior in GaN MIS-HEMT with LPCVD SiNx gate dielectric |
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Chin. Phys. B
2020 Vol.29 (3): 37201-037201
[Abstract]
(685)
[HTML 1 KB]
[PDF 1180 KB]
(195)
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