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Other articles related with "failure analysis"：
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48201 |
Yuqi Li(李钰琦), Yaxiang Lu(陆雅翔), Liquan Chen(陈立泉), Yong-Sheng Hu(胡勇胜) |
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Failure analysis with a focus on thermal aspect towards developing safer Na-ion batteries |
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Chin. Phys. B
2020 Vol.29 (4): 48201-048201
[Abstract]
(182)
[HTML 1 KB]
[PDF 7004 KB]
(540)
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87804 |
Li Jun-Tao (李俊焘), Liu Bo (刘波), Song Zhi-Tang (宋志棠), Ren Kun (任堃), Zhu Min (朱敏), Xu Jia (徐佳), Ren Jia-Dong (任佳栋), Feng Gao-Ming (冯高明), Ren Wan-Chun (任万春), Tong Hao (童浩) |
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Thermal effect of Ge2Sb2Te5 in phase change memory device |
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Chin. Phys. B
2014 Vol.23 (8): 87804-087804
[Abstract]
(596)
[HTML 1 KB]
[PDF 3626 KB]
(767)
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