Cryogenic transmission electron microscopy on beam-sensitive materials and quantum science

doi:10.1088/1674-1056/ad5af0

Abstract Transmission electron microscopy (TEM) offers unparalleled atomic-resolution imaging of complex materials and heterogeneous structures. However, high-energy imaging electrons can induce structural damage, posing a challenge for electron-beam-sensitive materials. Cryogenic TEM (Cryo-TEM) has revolutionized structural biology, enabling the visualization of biomolecules in their near-native states at unprecedented detail. The low electron dose imaging and stable cryogenic environment in Cryo-TEM are now being harnessed for the investigation of electron-beam-sensitive materials and low-temperature quantum phenomena. Here, we present a systematic review of the interaction mechanisms between imaging electrons and atomic structures, illustrating the electron beam-induced damage and the mitigating role of Cryo-TEM. This review then explores the advancements in low-dose Cryo-TEM imaging for elucidating the structures of organic-based materials. Furthermore, we showcase the application of Cryo-TEM in the study of strongly correlated quantum materials, including the detection of charge order and novel topological spin textures. Finally, we discuss the future prospects of Cryo-TEM, emphasizing its transformative potential in unraveling the complexities of materials and phenomena across diverse scientific disciplines.

Keywords: cryogenic TEM low dose imaging quantum materials

Received: 30 April 2024
Revised: 17 June 2024
Accepted manuscript online: 24 June 2024

PACS:	68.37.Lp	(Transmission electron microscopy (TEM))
	78.55.Kz	(Solid organic materials)
	71.45.Lr	(Charge-density-wave systems)

Fund: Project supported by the National Natural Science Foundation of China (Grant No. 11974156), the Guangdong Innovative and Entrepreneurial Research Team Program (Grant No. 2019ZT08C044), the Shenzhen Science and Technology Program (Grant Nos. KQTD20190929173815000 and 20200925161102001), and the Science, Technology and Innovation Commission of Shenzhen Municipality (Grant No. ZDSYS20190902092905285).

Corresponding Authors: Jun-Hao Lin
E-mail: linjh@sustech.edu.cn

Cite this article:

Gang Wang(王刚) and Jun-Hao Lin(林君浩) Cryogenic transmission electron microscopy on beam-sensitive materials and quantum science 2024 Chin. Phys. B 33 086801

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