AbstractThe third-order optical nonlinearity of Ag-O-Cs thin films, where Ag nanoparticles are embedded into a CsxO semiconductor matrix, was measured by the femtosecond optical Kerr technique. The third-order nonlinear optical susceptibility, $\chi$(3), of the thin films was estimated to be 1.1×10-9 esu at the incident wavelength of 820 nm. The response time, i.e. the full width at half-maximum of the Kerr signal, is as fast as 114 fs only. The intrinsic third-order optical nonlinearity can be attributed to the intraband transition of electrons from the occupied state near the Fermi level to the unoccupied state. It is suggested that such a nonlinearity is further enhanced by the local field effect that is present in the metallic nanoparticles composite thin films.
Received: 14 March 2001
Accepted manuscript online:
Fund: Project supported partly by the National Natural Science Foundation of China (Grant No. 60071017) and the Natural Science Foundation of Beijing, China (Grant No. 2992019).
Cite this article:
Zhang Qi-feng (张琦锋), Shao Qing-yi (邵庆益), Hou Shi-min (侯士敏), Zhang Geng-min (张耿民), Liu Wei-min (刘惟敏), Xue Zeng-quan (薛增泉), Wu Jin-lei (吴锦雷), Wang Shu-feng (王树峰), Liang Rui-sheng (梁瑞生), Huang Wen-tao (黄文涛), Wang Dan-ling (王丹翎), Gong Qi-huang (龚旗煌) LARGE AND EXTREMELY FAST THIRD-ORDER NON-LINEARITY OF Ag NANOPARTICLES EMBEDDED INTO A CsxO SEMICONDUCTOR MATRIX 2001 Chinese Physics 10 65
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