Direct visualization of structural defects in 2D semiconductors
Yutuo Guo(郭玉拓), Qinqin Wang(王琴琴), Xiaomei Li(李晓梅), Zheng Wei(魏争), Lu Li(李璐), Yalin Peng(彭雅琳), Wei Yang(杨威), Rong Yang(杨蓉), Dongxia Shi(时东霞), Xuedong Bai(白雪冬), Luojun Du(杜罗军), and Guangyu Zhang(张广宇)
Chin. Phys. B
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2022, (7): 76105
-076105
.
DOI: 10.1088/1674-1056/ac6738
