Chin. Phys. B
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Chin. Phys. B  2018, Vol. 27 Issue (6): 068505    DOI: 10.1088/1674-1056/27/6/068505
INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY Current Issue| Next Issue| Archive| Adv Search |
Physics-based analysis and simulation model of electromagnetic interference induced soft logic upset in CMOS inverter
Yu-Qian Liu(刘彧千)1, Chang-Chun Chai(柴常春)1, Yu-Hang Zhang(张宇航)2, Chun-Lei Shi(史春蕾)1, Yang Liu(刘阳)1, Qing-Yang Fan(樊庆扬)1, Yin-Tang Yang(杨银堂)1
1 Key Laboratory of Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University, Xi'an 710071, China;
2 Department of Micro-Nano Electronics, Shanghai Jiao Tong University, Shanghai 200240, China

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