Nonlinear effect of the structured light profilometry in the phase-shifting method and error correction

doi:10.1088/1674-1056/23/4/044212

Abstract Digital structured light (SL) profilometry is increasingly used in three-dimensional (3D) measurement technology. However, the nonlinearity of the off-the-shelf projectors and cameras seriously reduces the measurement accuracy. In this paper, first, we review the nonlinear effects of the projector-camera system in the phase-shifting structured light depth measurement method. We show that high order harmonic wave components lead to phase error in the phase-shifting method. Then a practical method based on frequency domain filtering is proposed for nonlinear error reduction. By using this method, the nonlinear calibration of the SL system is not required. Moreover, both the nonlinear effects of the projector and the camera can be effectively reduced. The simulations and experiments have verified our nonlinear correction method.

Keywords: structured light profilometry depth measurement phase-shifting algorithm nonlinear effect

Received: 21 August 2013
Revised: 16 September 2013
Accepted manuscript online:

PACS:	42.30.-d	(Imaging and optical processing)
	42.30.Rx	(Phase retrieval)
	42.30.Kq	(Fourier optics)
	42.30.Wb	(Image reconstruction; tomography)

Fund: Project supported by the Science and Technology MajorProjects of Zhejiang Province, China (Grant No. 2013C03043-5).

Corresponding Authors: Lin Bin
E-mail: wjlin@zju.edu.cn

About author: 42.30.-d; 42.30.Rx; 42.30.Kq; 42.30.Wb

Cite this article:

Zhang Wan-Zhen (张万祯), Chen Zhe-Bo (陈浙泊), Xia Bin-Feng (夏彬峰), Lin Bin (林斌), Cao Xiang-Qun (曹向群) Nonlinear effect of the structured light profilometry in the phase-shifting method and error correction 2014 Chin. Phys. B 23 044212

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Nonlinear effect of the structured light profilometry in the phase-shifting method and error correction

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