Theoretical study of electron-impact broadening for highly charged Ar XV ion lines
Chao Wu(吴超), Xiang Gao(高翔), Yu-Hao Zhu(朱宇豪), Xiao-Ying Han(韩小英), Bin Duan(段斌),Ju Meng(孟举), Song-Bin Zhang(张松斌), Jun Yan(颜君), Yong Wu(吴勇), and Jian-Guo Wang(王建国)
Chin. Phys. B
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2023, (5): 53101
-053101
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DOI: 10.1088/1674-1056/acb769
