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Other articles related with "off-stoichiometry"：
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47901 |
Ze-Song Wang(王泽松), Ren-Zheng Xiao(肖仁政), Chang-Wei Zou(邹长伟), Wei Xie(谢伟), Can-Xin Tian(田灿鑫), Shu-Wen Xue(薛书文), Gui-Ang Liu(刘贵昂), Neena Devi, De-Jun Fu(付德君) |
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Off-stoichiometry indexation of BiFeO3 thin film on silicon by Rutherford backscattering spectrometry |
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Chin. Phys. B
2018 Vol.27 (4): 47901-047901
[Abstract]
(823)
[HTML 1 KB]
[PDF 1053 KB]
(289)
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