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Other articles related with "measurement sequence"：
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128501 |
Xin Xie(解鑫), Da-Wei Bi(毕大伟), Zhi-Yuan Hu(胡志远), Hui-Long Zhu(朱慧龙), Meng-Ying Zhang(张梦映), Zheng-Xuan Zhang(张正选), Shi-Chang Zou(邹世昌) |
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Influence of characteristics' measurement sequence on total ionizing dose effect in PDSOI nMOSFET |
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Chin. Phys. B
2018 Vol.27 (12): 128501-128501
[Abstract]
(645)
[HTML 1 KB]
[PDF 1013 KB]
(150)
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