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Other articles related with "indium-zinc oxide"：
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68504 |
Li Wang(王黎), Yuan Liu(刘远), Kui-Wei Geng(耿魁伟), Ya-Yi Chen(陈雅怡), Yun-Fei En(恩云飞) |
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Degradation of current-voltage and low frequency noise characteristics under negative bias illumination stress in InZnO thin film transistors |
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Chin. Phys. B
2018 Vol.27 (6): 68504-068504
[Abstract]
(554)
[HTML 0 KB]
[PDF 1319 KB]
(253)
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106103 |
Cai Xi-Kun(才玺坤), Yuan Zi-Jian(原子健), Zhu Xia-Ming(朱夏明), Wang Xiong(王雄), Zhang Bing-Po(张兵坡), Qiu Dong-Jiang(邱东江), and Wu Hui-Zhen(吴惠桢) |
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Structural, electrical, and optical properties of ZnInO alloy thin films |
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Chin. Phys. B
2011 Vol.20 (10): 106103-106103
[Abstract]
(1347)
[HTML 0 KB]
[PDF 290 KB]
(1255)
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